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US 12,014,660 B2Granted
Method of testing a microdevice in integrated systems
AssigneeVueReal Inc.
InventorGholamreza Chaji
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Abstract
What is disclosed are structures and methods for testing and repairing emissive display systems. Systems are tested with use of temporary electrodes which allow operation of the system during testing and are removed afterward. Systems are repaired after identification of defective devices with use of redundant switching from defective devices to functional devices provided on repair contact pads.
Claims10
A method of testing a microdevice on a substrate, the method comprising:
- using a temporary and removable external electrode to bias transferred microdevices in the substrate;
- providing an electrical coupling between the temporary and removable external electrode and a floating contact of the microdevice, in a partially or fully populated system, to stimulate the microdevice;
- applying at least one alternating-current (AC) voltage to the microdevice coupled to the temporary and removable external electrode;
- extracting different microdevice parameters from a response generated by the coupling;
- and
- removing the temporary and removable external electrode.
3 more elements
Dependencies are inferred from the claim text.