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US 12,009,045 B2Granted
Management of multiple memory in-field self-repair options
AssigneeTexas Instruments Incorporated
InventorsDevanathan Varadarajan, Varun Singh
Life of this patent
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Abstract
A system includes a processor and a memory set coupled to the processor. The system also includes a repair circuit coupled to the memory set. The repair circuit includes a first repair circuit and a second repair circuit. The repair circuit also includes a test controller configured to select between the first repair circuit and the second repair circuit to perform an in-field self-repair of the memory set.
Claims20
A circuit comprising:
- a memory;
- and
- a memory repair circuit coupled to the memory, comprising:
- a first repair circuit configured to repair an error in the memory using an error correcting code;
- and
- a second repair circuit configured to repair an error in the memory using a redundant portion of the memory,
- wherein the memory repair circuit is configured to:
- receive stored test data from the memory;
- determine an error in the memory based on the stored test data;
- select one of the first repair circuit and the second repair circuit based on enablement of the first repair circuit and the second repair circuit;
- and
- repair the determined error in the memory with the selected repair circuit.
9 more elements
A method comprising:
- receiving, by a memory repair circuit, stored test data;
- determining, by the memory repair circuit, an error in a memory based on the stored test data;
- selecting, by the memory repair circuit, one of a first repair circuit and a second repair circuit based on enablement of the first repair circuit and the second repair circuit, wherein the first repair circuit repairs an error in the memory using an error correcting code, and wherein the second repair circuit repairs an error in the memory using a redundant portion of the memory;
- and
- repairing, by the memory repair circuit, the determined error in the memory using the selected repair circuit.
2 more elements
Dependencies are inferred from the claim text.