# US 12,008,735 B2 · Dual energy detector and method for improving image data generated thereby > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 12,008,735 B2 - Document ID: US12008735B2 - Status: Granted - Kind: B2 - Application number: 17/415,968 - Filed: 2019-12-20 - Published: 2022-07-14 - Granted: 2024-06-11 - Earliest claimed: 2018-12-21 - Assignees: Smiths Detection Germany GmbH - Applicants: Smiths Heimann GmbH - Inventors: Alexander Frank - Web page: https://patentgrep.com/patent/US12008735B2 ## CPC - G01V 5/224: {Multiple energy techniques using one type of radiation, e.g. X-rays of different energies} - G06T 5/50: using two or more images, e.g. averaging or subtraction - G06T 3/10: Selection of transformation methods according to the characteristics of the input images - G06T 2207/10116: X-ray image - G06T 2207/20216: Image averaging - G06T 2207/20228: Disparity calculation for image-based rendering - G01V: GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS (means for indicating the location of accidentally buried, e.g. snow-buried, persons A63B29/02) - G06T: IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ## Abstract A dual-energy X-ray detector includes a detector line arranged transversely to the sampling direction, including first and second detector elements which respond differently to an X-ray spectrum and which are each arranged alternately next to one another in the detector line, the first and second detector elements each producing based on X-ray radiation (XR) independently of one another in each case only corresponding first or second detector data. ## Claims ### Claim 1 A method for correcting detector data provided by an inspection apparatus that includes a dual-energy X-ray detector, wherein the dual-energy X-ray detector includes a detector line arranged transversely to a sampling direction, the detector line including first detector elements and second detector elements which are differently responsive to an X-ray spectrum, which are arranged alternately adjacent to each other in the detector line, wherein the first and second detector elements detect X-ray radiation independently of each other and the first detector elements generate corresponding first detector data and the second detector elements generate second detector data, and wherein the inspection apparatus is arranged for transporting in the sampling direction inspection objects through the inspection apparatus for performing an imaging inspection for non-destructive inspection of the inspection objects and for providing detector data describing the inspection objects based on detection of X-rays X-raying the inspection objects with the dual-energy X-ray detector, the method comprising: (a1) deriving missing second detector data for a location of a first detector element of the first detector elements by: determining an interpolation value of measured second detector data from second detector elements adjacent to said first detector element; determining a correction value based on first detector data measured with said first detector element and adjacent measured first detector data; and correcting the interpolation value with the correction value; and/or (a2) deriving missing first detector data for a location of a second detector element of the second detector elements by: determining an interpolation value of measured first detector data from first detector elements adjacent to said second detector element; determining a correction value based on second detector data measured with said second detector element and adjacent measured second detector data; and correcting the interpolation value with the correction value; and wherein the method further comprises correcting an assigned brightness value determined based on determined detector data of a pixel by: (b1) determining material values for all pixels based on actual detector data measured for each pixel and the detector data determined for each pixel, wherein the material values associated with the pixels define a material information matrix by storing a Z-effective value as a material value in the material information matrix for each pixel corresponding to a detector element; (b2) filtering the material values determined for all pixels in the material information matrix by means of a mean-based or median-based filter operation which detects N×N material values around each pixel, where N is an integer greater than 3, preferably N=5; (b3) determining, at each pixel where first detector data has been measured, theoretical second detector data associated with that pixel based on the material value determined for that pixel; and (b4) determining for all pixels a respective brightness value based on the measured second detector data or the theoretical second detector data available for the respective pixel. ### Claim 2 (depends on 1) The method of claim 1, wherein the first detector elements and second detector elements each include a photodiode each provided with a scintillator material selected to adjust sensitivity to X-rays of the X-ray spectrum and dimensioned in a thickness to be X-rayed by the X-rays. ### Claim 3 (depends on 1) The method of claim 1, where the first detector elements and the second detector elements are on the same side of a substrate, or the first detector elements are on one side of the substrate and the second detector elements are on the other side of the substrate. ### Claim 4 (depends on 1) The method according to claim 1, wherein determining the correction value in step (a1) comprises taking a difference of n times the detector data measured with the first detector element and a sum of n first detector data measured adjacent in the detector line; and/or determining the correction value in step (a2) comprises taking the difference of n times the detector data measured with the second detector element and the sum of n second detector data measured adjacent in the detector line; where n is an integer, even number with n>=2. ### Claim 5 (depends on 1) The method according to claim 1, wherein the correction value is a correction factor and correcting the interpolation value with the correction value comprises multiplying the interpolation value by the correction factor; and wherein determining the correction factor in step (a1) comprises taking the difference of 1 and a quotient of a difference of the two second detector data measured in the detector line adjacent to the left and right sides and the sum of the two second detector data measured in the detector line adjacent to the left and right sides; or determining the correction factor in step (a2) comprises forming the difference of 1 and a quotient of a difference of the two first detector data measured in the detector line adjacent to the left side and adjacent to the right side and the sum of the two first detector data measured in the detector line adjacent to the left side and adjacent to the right side. ### Claim 6 (depends on 1) A processing device for correcting detector data, the processing device arranged to perform a method according to claim 1. ### Claim 7 (depends on 1) A computer program product comprising a computer program having software means for performing a method according to claim 1, when the computer program is executed on a computer, in particular on a processing device. ### Claim 8 (depends on 7) A data carrier with the computer program product according to claim 7. ### Claim 9 (depends on 1) A data stream comprising electronically readable control signals capable of interacting with a programmable computer such that when the computer executes the electronically readable control signals, the computer performs a method according to claim 1. ### Claim 10 A method for correcting detector data provided by an inspection apparatus that includes a dual-energy X-ray detector, wherein the dual-energy X-ray detector includes a detector line arranged transversely to a sampling direction, the detector line including first detector elements and second detector elements which are differently responsive to an X-ray spectrum, which are arranged alternately adjacent to each other in the detector line, wherein the first and second detector elements detect X-ray radiation independently of each other and the first detector elements generate corresponding first detector data and the second detector elements generate second detector data, and wherein the inspection apparatus is arranged for transporting in the sampling direction inspection objects through the inspection apparatus for performing an imaging inspection for non-destructive inspection of the inspection objects and for providing detector data describing the inspection objects based on detection of X-rays X-raying the inspection objects with the dual-energy X-ray detector, the method comprising: (a1) deriving missing second detector data for a location of a first detector element of the first detector elements by: determining an interpolation value of measured second detector data from second detector elements adjacent to said first detector element; determining a correction value based on first detector data measured with said first detector element and adjacent measured first detector data; and correcting the interpolation value with the correction value; and/or (a2) deriving missing first detector data for a location of a second detector element of the second detector elements by: determining an interpolation value of measured first detector data from first detector elements adjacent to said second detector element; determining a correction value based on second detector data measured with said second detector element and adjacent measured second detector data; and correcting the interpolation value with the correction value; and wherein determining the correction value in step (a1) comprises taking a difference of n times the detector data measured with the first detector element and a sum of n first detector data measured adjacent in the detector line; and/or determining the correction value in step (a2) comprises taking the difference of n times the detector data measured with the second detector element and the sum of n second detector data measured adjacent in the detector line; where n is an integer, even number with n>=2. ### Claim 11 A method for correcting detector data provided by an inspection apparatus that includes a dual-energy X-ray detector, wherein the dual-energy X-ray detector includes a detector line arranged transversely to a sampling direction, the detector line including first detector elements and second detector elements which are differently responsive to an X-ray spectrum, which are arranged alternately adjacent to each other in the detector line, wherein the first and second detector elements detect X-ray radiation independently of each other and the first detector elements generate corresponding first detector data and the second detector elements generate second detector data, and wherein the inspection apparatus is arranged for transporting in the sampling direction inspection objects through the inspection apparatus for performing an imaging inspection for non-destructive inspection of the inspection objects and for providing detector data describing the inspection objects based on detection of X-rays X-raying the inspection objects with the dual-energy X-ray detector, the method comprising: (a1) deriving missing second detector data for a location of a first detector element of the first detector elements by: determining an interpolation value of measured second detector data from second detector elements adjacent to said first detector element; determining a correction value based on first detector data measured with said first detector element and adjacent measured first detector data; and correcting the interpolation value with the correction value; and/or (a2) deriving missing first detector data for a location of a second detector element of the second detector elements by: determining an interpolation value of measured first detector data from first detector elements adjacent to said second detector element; determining a correction value based on second detector data measured with said second detector element and adjacent measured second detector data; and correcting the interpolation value with the correction value; and wherein the correction value is a correction factor and correcting the interpolation value with the correction value comprises multiplying the interpolation value by the correction factor; and wherein determining the correction factor in step (a1) comprises taking the difference of 1 and a quotient of a difference of the two second detector data measured in the detector line adjacent to the left and right sides and the sum of the two second detector data measured in the detector line adjacent to the left and right sides; or determining the correction factor in step (a2) comprises forming the difference of 1 and a quotient of a difference of the two first detector data measured in the detector line adjacent to the left side and adjacent to the right side and the sum of the two first detector data measured in the detector line adjacent to the left side and adjacent to the right side.