# US 12,007,514 B2 · Dynamic X-ray detecting panel, X-ray detector having the same, and method of driving X-ray detector

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- Number: US 12,007,514 B2
- Document ID: US12007514B2
- Status: Granted
- Kind: B2
- Application number: 17/512,300
- Filed: 2021-10-27
- Published: 2023-03-16
- Granted: 2024-06-11
- Earliest claimed: 2021-09-14
- Assignees: Biosenstech Inc
- Applicants: Biosenstech Inc
- Inventors: Seung Ik Jun; Han Bin Jang; Jae Hoon Choi
- Web page: https://patentgrep.com/patent/US12007514B2

## CPC

- G01T 1/247: {Detector read-out circuitry (for processing gain or off-set correction H04N)}
- G01T 1/20184: {Detector read-out circuitry, e.g. for clearing of traps, compensating for traps or compensating for direct hits}
- H04N 5/32: Transforming X-rays (cameras or camera modules for generating image signals from X-rays H04N23/30; circuitry of SSIS for transforming X-rays into image signals H04N25/30)
- H10F 30/29: the devices being sensitive to radiation having very short wavelengths, e.g. X-rays, gamma-rays or corpuscular radiation
- H10F 39/016: {of thin-film-based image sensors}
- H10F 39/189: {X-ray, gamma-ray or corpuscular radiation imagers}
- G01T: MEASUREMENT OF NUCLEAR OR X-RADIATION (radiation analysis of materials, mass spectrometry G01N23/00; tubes for determining the presence, intensity, density or energy of radiation or particles H01J47/00)
- H04N: PICTORIAL COMMUNICATION, e.g. TELEVISION
- H10F: INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION

## Abstract

A dynamic X-ray detecting panel, an X-ray detector including the same, and a method of driving an X-ray detector are disclosed. The method of driving the X-ray detector is a method of driving a dynamic X-ray detector including the X-ray detecting panel. The X-ray detecting panel includes multiple pixels arranged in a matrix, each of the pixels includes a readout thin film transistor, a reset thin film transistor, and a photodiode, and line reset, window time, and readout proceed with respect to the multiple pixels in each row.

## Claims

### Claim 1

A method of driving a dynamic X-ray detector including an X-ray detecting panel, wherein line reset, window time, and readout proceed in order for each frame time, row by row, with respect to multiple pixels in an active image area, each of the multiple pixels including a readout thin film transistor, a reset thin film transistor, and a photodiode,
wherein each of a reset time, the window time, and a readout time is identically defined at all frame times with respect to pixels of all rows in the active image area,
wherein start of line reset of a subsequent row is later than start of line reset of a previous row, and
wherein a time interval between readout and line reset following the readout is longer than window time between line reset and readout following the line reset in each row.

### Claim 2 (depends on 1)

The method of driving a dynamic X-ray detector according to claim 1, wherein start of window time of a subsequent row is later than start of window time of a previous row and readout of the pixels in the subsequent row is performed after completion of readout of the pixels in the previous row.

### Claim 3 (depends on 2)

The method of driving a dynamic X-ray detector according to claim 2, wherein completion of readout of the previous row coincides with completion of the window time of the subsequent row.

### Claim 4 (depends on 3)

The method of driving a dynamic X-ray detector according to claim 3, wherein a reset time is longer than a readout time and an idle time corresponding to a difference between the reset time and the readout time is defined after completion of the readout time.

### Claim 5 (depends on 2)

The method of driving a dynamic X-ray detector according to claim 2, wherein line reset of the subsequent row starts after completion of line reset of the previous row.

### Claim 6 (depends on 5)

The method of driving a dynamic X-ray detector according to claim 5, wherein a reset time is shorter than a readout time and an idle time corresponding to a difference between the reset time and the readout time is defined after completion of the reset time.

### Claim 7 (depends on 2)

The method of driving a dynamic X-ray detector according to claim 2, wherein line reset of the subsequent row is performed before completion of line reset of the previous row and line reset of the subsequent row is completed a predetermined period of time after completion of line reset of the previous row.

### Claim 8 (depends on 1)

The method of driving a dynamic X-ray detector according to claim 1, wherein:
upon line reset, the reset thin film transistors of a corresponding row are in an ON state and the readout thin film transistors thereof are in an OFF state;
during the window time, the reset thin film transistors of a corresponding row are in an OFF state and the readout thin film transistors thereof are in an OFF state; and
upon readout, the reset thin film transistors of a corresponding row are in an OFF state and the readout thin film transistors thereof are in an ON state.

### Claim 9 (depends on 8)

The method of driving a dynamic X-ray detector according to claim 8, wherein:
gates of the readout thin film transistors in the pixels of each row are commonly connected to one readout gate pad;
drains of the readout thin film transistors in the pixels of each row are connected to different readout pads, respectively;
gates of the reset thin film transistors in the pixels of each row are commonly connected to one reset gate pad;
drains of the reset thin film transistors in the multiple pixels are commonly connected to a reset drain pad; and
the photodiode in each of the pixels is commonly connected to sources of the reset thin film transistor and the readout thin film transistor therein.