Device for testing a group of radio-frequency (RF) chip modules and method for using the same

A device for testing a group of radio-frequency (RF) chip modules comprising:

• a signal analyzer configured to generate a radio-frequency (RF) signal;
• a power divider electrically connected to the signal analyzer and a plurality of radio-frequency (RF) chip modules, wherein the power divider is configured to receive the RF signal, generate radio-frequency (RF) input signals in response to the RF signal, and respectively transmit the RF input signals to the plurality of RF chip modules, wherein total power of the RF input signals is equal to power of the RF signal;
• a plurality of control ICs respectively integrated into the plurality of RF chip modules, wherein the plurality of control ICs is respectively configured to receive the RF input signals through the plurality of RF chip modules;
• a signal controller electrically connected to the plurality of control ICs, wherein the signal controller is configured to control each of the plurality of control ICs to adjust at least one of power and a phase of the corresponding RF input signal to generate a radio-frequency (RF) output signal;
• and
• a power combiner electrically connected to each of the plurality of control ICs and the signal analyzer, wherein the power combiner is configured to receive the RF output signal from each of the plurality of control ICs and sum power of the RF output signals of the plurality of control ICs to generate a test signal, and the signal analyzer is configured to receive the test signal and obtain radio-frequency (RF) properties corresponding to at least one of power and a phase of each of the RF output signals of the plurality of control ICs.

A method for testing a group of radio-frequency (RF) chip modules comprising:

• receiving a radio-frequency (RF) signal, generating radio-frequency (RF) input signals in response to the RF signal, and respectively transmitting the RF input signals to a plurality of RF chip modules, wherein total power of the RF input signals is equal to power of the RF signal;
• receiving the RF input signals through the plurality of RF chip modules and adjusting at least one of power and a phase of each of the RF input signals to generate radio-frequency (RF) output signals;
• summing power of the RF output signals to generate a test signal;
• and
• receiving the test signal and obtaining radio-frequency (RF) properties corresponding to at least one of power and phase of each of the RF output signals.