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US 12,007,420 B2Granted
Potential measurement device
AssigneeSony Semiconductor Solutions Corporation
InventorKoji Ogawa
Life of this patent
Estimating the term…
Abstract
Provided is a potential measurement device including: a first substrate having read electrodes arranged in a two-dimensional array; and a second substrate on which the first substrate is stacked, in which each of the read electrodes includes at least one or more AD conversion circuits each having independent correspondence to the read electrode, and at least a part of the AD conversion circuits is arranged in a two-dimensional array on the second substrate.
Claims11
A potential measurement device, comprising:
- a first substrate having a plurality of read electrodes arranged in a two-dimensional array;
- a second substrate on which the first substrate is stacked, wherein
- each read electrode of the plurality of read electrodes is associated with one or more AD conversion circuits,
- each AD conversion circuit of the one or more AD conversion circuits has independent correspondence to a read electrode of the plurality of read electrodes, and
- at least a part of the one or more AD conversion circuits is arranged in a two-dimensional array on the second substrate;
- and
- an amplifier circuit in a signal path from each read electrode of the plurality of read electrodes to each AD conversion circuit of the one or more AD conversion circuits.
4 more elements
Dependencies are inferred from the claim text.