Inspection device, PTP packaging machine and calibration method of inspection device

An inspection device that performs an inspection using spectral analysis based on spectroscopic image data, the inspection device comprising:

• an illumination device that irradiates a standard object and an inspection object with near-infrared light;
• a spectroscope that disperses reflected light reflected from the standard object and the inspection object irradiated with the near-infrared light;
• an imaging device that comprises an imaging element comprising a plurality of light-receiving elements in a matrix arrangement, and takes images of first and second optical spectrums of the reflected light dispersed by the spectroscope to obtain standard spectroscopic image data of the standard object and inspection spectroscopic image data of the inspection object;
• and
• a processor that:
• executes a predetermined arithmetic operation with regard to each of pixel rows of the standard spectroscopic image data perpendicular to a wavelength dispersion direction of the first optical spectrum of the reflected light from the standard object, wherein the processor, based on luminance values of pixels belonging to each of the pixel rows, determines a characteristic of each of the pixel rows and grasps a wavelength sensitivity characteristic of the imaging element under the near-infrared light emitted from the illumination device;
• executes a predetermined arithmetic operation with regard to each of pixel columns of the standard spectroscopic image data parallel to the wavelength dispersion direction, wherein the processor, based on luminance values of pixels belonging to each of the pixel columns, determines a characteristic of each of the pixel columns and grasps a luminance characteristic in an imaging area width direction under the near-infrared light emitted from the illumination device;
• calculates a correction value with regard to each of coordinate positions corresponding to each of pixels of the standard spectroscopic image data by:
• multiplying the characteristic of each of the pixel rows to which the pixels belongs, by the characteristic of each of the pixel columns to which the pixels belongs to obtain a multiplied value, and
• dividing the multiplied value by a luminance value of each of the pixels of the standard spectroscopic image data to obtain a divided value as the correction value,
• corrects a luminance value of each of the pixels of the inspection spectroscopic image data, by multiplying the luminance value of each of the pixels of the inspection spectroscopic image data by the correction value, to obtain corrected spectroscopic image data;
• obtains spectral data based on the corrected spectroscopic image data;
• and
• executes a predetermined analysis process with regard to the inspection object based on the spectral data.