# US 12,001,325 B2 · Test data generation apparatus, test data generation method and program > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 12,001,325 B2 - Document ID: US12001325B2 - Status: Granted - Kind: B2 - Application number: 17/777,959 - Filed: 2019-11-20 - Published: 2022-11-03 - Granted: 2024-06-04 - Earliest claimed: 2019-11-20 - Assignees: Nippon Telegraph and Telephone Corporation - Applicants: Nippon Telegraph and Telephone Corporation - Inventors: Yu Adachi; Haruto Tanno; Yu Yoshimura; Hiroyuki Kirinuki; Toshiyuki Kurabayashi - Web page: https://patentgrep.com/patent/US12001325B2 ## CPC - G06F 11/3684: {for test design, e.g. generating new test cases} - G06F 11/3698: Environments for analysis, debugging or testing of software - G06F 11/3688: {for test execution, e.g. scheduling of test suites} - G06F 11/3692: {for test results analysis} - G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N) ## Abstract A test data generation device that generates test data to be input into an input field of a test target application includes a storage unit that stores a tacit knowledge test data dictionary including, for each tacit knowledge category, a generation method, test data information, and an input value constraint on an input field to be used as a generation condition, and a generation unit that refers to, regarding a certain tacit knowledge category for a target input field, the tacit knowledge test data dictionary to generate test data for the target input field when an input value constraint of the target input field in the test target application and an input value constraint of a generation condition regarding the tacit knowledge category are determined to match, and not to generate the test data for the target input field when the input value constraint of the target input field and the input value constraint of the generation condition regarding the tacit knowledge category are determined not to match. ## Claims ### Claim 1 A test data generation device comprising a storage device and a processor configured to execute a method comprising: storing, in the storage device, a tacit knowledge test data dictionary including, for a tacit knowledge category, a generation process, test data information, and an input value constraint of an input field to be used as a generation condition; and generating, for the tacit knowledge category for a target input field representing an input field for a test data generation target, by referring the tacit knowledge test data dictionary, test data for the target input field when an input value constraint of the target input field in a test target application matches with an input value constraint of the generation condition associated with the tacit knowledge category, except when the input value constraint of the target input field and the input value constraint of the generation condition associated with the tacit knowledge category do not match. ### Claim 2 (depends on 1) The test data generation device according to claim 1, wherein the generating further includes generating the test data for the target input field when no generation condition for the tacit knowledge category is present in the tacit knowledge test data dictionary. ### Claim 3 (depends on 2) The test data generation device according to claim 2, wherein the test data is associated with an input variation test of the test target application. ### Claim 4 (depends on 2) The test data generation device according to claim 2, wherein the matching of the input value constraint of the target input field in the test target application and the input value constraint of the generation condition associated with the tacit knowledge category is based at least on an input data type. ### Claim 5 (depends on 2) The test data generation device according to claim 2, wherein the generation process is based on a regular expression. ### Claim 6 (depends on 1) The test data generation device according to claim 1, wherein the test data is associated with an input variation test of the test target application. ### Claim 7 (depends on 1) The test data generation device according to claim 1, wherein the matching of the input value constraint of the target input field in the test target application and the input value constraint of the generation condition associated with the tacit knowledge category is based at least on an input data type. ### Claim 8 (depends on 1) The test data generation device according to claim 1, wherein the generation process is based on a regular expression. ### Claim 9 A test data generation device comprising a storage device and a processor configured to execute a method comprising: storing, in the storage device, a tacit knowledge test data dictionary including, in a tacit knowledge category, a generation process and test data information; and generating, for the tacit knowledge category for a target input field representing an input field for a test data generation target, by referring to the tacit knowledge test data dictionary, test data satisfying an input value constraint of the target input field based on a regular expression. ### Claim 10 (depends on 9) The test data generation device according to claim 9, wherein the input value constraint includes a character string length or a numerical value range. ### Claim 11 (depends on 10) The test data generation device according to claim 10, wherein the test data is associated with an input variation test of a test target application. ### Claim 12 (depends on 10) The test data generation device according to claim 10, wherein the generation process is based on a regular expression. ### Claim 13 (depends on 9) The test data generation device according to claim 9, wherein the test data is associated with an input variation test of a test target application. ### Claim 14 (depends on 9) The test data generation device according to claim 9, wherein the generation process is based on a regular expression. ### Claim 15 A computer-implemented method for generating test data, comprising: storing a tacit knowledge test data dictionary including, in a tacit knowledge category, a generation process, test data information, and an input value constraint of an input field to be used as a generation condition; and generating, for the tacit knowledge category for a target input field representing an input field for a test data generation target, by referring to the tacit knowledge test data dictionary, test data for the target input field when an input value constraint of the target input field in a test target application matches with an input value constraint of a generation condition associated with the tacit knowledge category, except when the input value constraint of the target input field and the input value constraint of the generation condition associated with the tacit knowledge category do not match. ### Claim 16 (depends on 15) The computer-implemented method according to claim 15, wherein the test data is associated with an input variation test of the test target application. ### Claim 17 (depends on 15) The computer-implemented method according to claim 15, wherein the matching of the input value constraint of the target input field in the test target application and the input value constraint of the generation condition associated with the tacit knowledge category is based at least on an input data type. ### Claim 18 (depends on 15) The computer-implemented method according to claim 15, wherein the generation process is based on a regular expression.