# US 12,000,889 B2 · Signal generation device, measurement device, and method

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- Number: US 12,000,889 B2
- Document ID: US12000889B2
- Status: Granted
- Kind: B2
- Application number: 17/857,260
- Filed: 2022-07-05
- Published: 2024-01-11
- Granted: 2024-06-04
- Earliest claimed: 2022-07-05
- Assignees: Rohde & Schwarz GmbH & Co. KG
- Applicants: Rohde & Schwarz GmbH & Co. KG
- Inventors: Benjamin Schneider; Mario Guenther
- Web page: https://patentgrep.com/patent/US12000889B2

## CPC

- G01R 31/2841: {Signal generators}
- G01R 31/31727: {Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks (G01R31/31725 takes precedence; concerning scan test G01R31/318552, for tester hardware G01R31/31922)}
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)

## Abstract

The present disclosure provides a signal generation device, comprising at least two signal generators, a clock source that is coupled to the at least two signal generators and that is configured to generate a clock signal and provide the clock signal to the at least two signal generators, wherein the signal paths between the clock source and each one of the at least two signal generators are matched at least regarding the signal runtime, and wherein the at least two signal generators are each configured to generate an output signal based on the clock signal. Further, the present disclosure provides a respective measurement device and a respective method.

## Claims

### Claim 1

A signal generation device, comprising:
at least two signal generators; and
a clock source that is coupled to the at least two signal generators and that is configured to generate a clock signal and provide the clock signal to the at least two signal generators;
wherein the signal paths between the clock source and each one of the at least two signal generators are matched at least regarding the signal runtime; and
wherein the at least two signal generators are each configured to generate an output signal based on the clock signal,
wherein the signal generation device comprises:
a first signal measurement sensor for each one of the at least two signal generators, and
a first signal comparator that is coupled on the input side to each one of the first signal measurement sensors and on the output side to at least all of the at least two signal generators but one of the at least two signal generators,
wherein each one of the first signal measurement sensors is configured to measure the output signal of the respective one of the at least two signal generators,
wherein the first signal comparator is configured to compare the amplitudes of the output signals and provide a respective amplitude correction factor to each one of the at least two signal generators to which the first signal comparator is coupled to,
wherein each one of the at least two signal generators to which the first signal comparator is coupled to comprises an amplitude controller configured to control the amplitude of the respective output signal based on the amplitude correction factor; or
the signal generation device comprises:
a second signal measurement sensor for each one of the at least two signal generators, and
a second signal comparator that is coupled on the input side to each one of the second signal measurement sensors and on the output side to at least all of the at least two signal generators but one of the at least two signal generators,
wherein each one of the second signal measurement sensors is configured to measure the output signal of the respective one of the at least two signal generators,
wherein the second signal comparator is configured to compare the phases of the output signals and provide a respective phase correction factor to each one of the at least two signal generators to which the second signal comparator is coupled to,
wherein each one of the at least two signal generators to which the second signal comparator is coupled to comprises a phase controller configured to control the phase of the respective output signal based on the phase correction factor.

### Claim 2 (depends on 1)

The signal generation device according to claim 1, wherein the at least two signal generators each comprises an arbitrary signal generator with a signal memory, wherein the arbitrary signal generator is configured to output an arbitrary signal based on signal data that is stored in the signal memory.

### Claim 3 (depends on 1)

The signal generation device according to claim 1, wherein the at least two signal generators each comprises a sine signal generator that is configured to output a sine signal with a predetermined frequency and amplitude.

### Claim 4 (depends on 1)

The signal generation device according to claim 1, wherein the at least two signal generators each comprises at least one of an attenuation/amplification unit or a phase shifter.

### Claim 5 (depends on 1)

The signal generation device according to claim 1, wherein the at least two signal generators each comprises a digital signal generation section and a digital-to-analog converter coupled to the digital signal generation section.

### Claim 6 (depends on 1)

The signal generation device according to claim 1, wherein the signal generation device is provided as an oscilloscope or as a frequency response analysis device.

### Claim 7 (depends on 1)

The signal generation device according to claim 1, wherein the at least two signal generators are configured to each output the respective output signal with at least one of a configurable phase offset, a configurable amplitude, or a configurable amplitude offset.

### Claim 8

A measurement device, comprising:
a signal generation device, the signal generation device comprising:
at least two signal generators,
a clock source that is coupled to the at least two signal generators and that is configured to generate a clock signal and provide the clock signal to the at least two signal generators,
wherein the signal paths between the clock source and each one of the at least two signal generators are matched at least regarding the signal runtime, and
wherein the at least two signal generators are each configured to generate an output signal for a device under test based on the clock signal; and
at least one signal measurement input configured to measure a signal generated by the device under test based on the output signals provided to the device under test
wherein the signal generation device comprises:
a first signal measurement sensor for each one of the at least two signal generators, and
a first signal comparator that is coupled on the input side to each one of the first signal measurement sensors and on the output side to at least all of the at least two signal generators but one of the at least two signal generators,
wherein each one of the first signal measurement sensors is configured to measure the output signal of the respective one of the at least two signal generators,
wherein the first signal comparator is configured to compare the amplitudes of the output signals and provide a respective amplitude correction factor to each one of the at least two signal generators to which the first signal comparator is coupled to,
wherein each one of the at least two signal generators to which the first signal comparator is coupled to comprises an amplitude controller configured to control the amplitude of the respective output signal based on the amplitude correction factor; or
wherein the signal generation device comprises:
a second signal measurement sensor for each one of the at least two signal generators, and
a second signal comparator that is coupled on the input side to each one of the second signal measurement sensors and on the output side to at least all of the at least two signal generators but one of the at least two signal generators,
wherein each one of the second signal measurement sensors is configured to measure the output signal of the respective one of the at least two signal generators,
wherein the second signal comparator is configured to compare the phases of the output signals and provide a respective phase correction factor to each one of the at least two signal generators to which the second signal comparator is coupled to,
wherein each one of the at least two signal generators to which the second signal comparator is coupled to comprises a phase controller configured to control the phase of the respective output signal based on the phase correction factor.

### Claim 9 (depends on 8)

The measurement device according to claim 8, wherein the at least two signal generators are configured to output a differential signal to a device under test.

### Claim 10 (depends on 8)

The measurement device according to claim 8, comprising a signal processor configured to calculate a frequency response for the device under test based on the output signals and the signal measured by the at least one signal measurement input.

### Claim 11

A method for operating a signal generation device, wherein the signal generation device comprises at least two signal generators, and a clock source that is coupled to the at least two signal generators, the method comprising:
generating with the clock source a clock signal;
providing the clock signal to the at least two signal generators via signal paths between the clock source and each one of the at least two signal generators that are matched at least regarding the signal runtime; and
generating an output signal based on the clock signal with each one of the at least two signal generators,
wherein the method further comprises:
measuring the output signal of each one of the at least two signal generators,
comparing the amplitudes of the measured output signals, and
providing a respective amplitude correction factor for at least each one of the measured output signals but one of the measured output signals,
wherein the amplitudes of the output signals are controlled based on the respective amplitude correction factor for each one of the output signals for which an amplitude correction factor is provided; or
wherein the method further comprises:
measuring the output signal of each one of the at least two signal generators,
comparing the phases of the measured output signals, and
providing a respective phase correction factor for all but one of the measured output signals,
wherein the phases of the output signals are controlled based on the phase correction factor for each one of the output signals for which a phase correction factor is provided.

### Claim 12 (depends on 11)

The method according to claim 11, wherein the output signals are generated with at least two signal generators that each comprises an arbitrary signal generator with a signal memory, wherein the arbitrary signal generator outputs an arbitrary signal based on signal data that is stored in the signal memory.

### Claim 13 (depends on 11)

The method according to claim 11, wherein the output signals are generated with at least two signal generators that each comprises a sine signal generator that is configured to output a sine signal with a predetermined frequency and amplitude.

### Claim 14 (depends on 11)

The method according to claim 11, wherein the output signals are generated with at least two signal generators that each comprises at least one of an attenuation/amplification unit or a phase shifter.

### Claim 15 (depends on 11)

The method according to claim 11, wherein the output signals are generated with an oscilloscope or a frequency response analysis device.

### Claim 16 (depends on 15)

The method according to claim 15, further comprising measuring at least one signal provided by a device under test based on the output signals provided to the device under test.
