# US 12,000,863 B2 · Probe pin having gripping structure

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- Number: US 12,000,863 B2
- Document ID: US12000863B2
- Status: Granted
- Kind: B2
- Application number: 17/927,772
- Filed: 2020-05-29
- Published: 2023-08-24
- Granted: 2024-06-04
- Earliest claimed: 2020-05-29
- Assignees: Tse Co., Ltd.
- Applicants: Tse Co., Ltd.
- Inventors: Seung Bae An; Byeong Soo Park
- Web page: https://patentgrep.com/patent/US12000863B2

## CPC

- G01R 1/06716: {Elastic}
- G01R 1/06738: {related to tip portion}
- G01R 1/06755: {Material aspects}
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)

## Abstract

A probe pin having an improved gripping structure is disclosed. The disclosed probe pin includes a pin body including a plurality of holes and positioned at one side, a first extension portion extending upward from an outer side of the pin body, a second extension portion elongated from the other end of the first extension portion, further extending than the pin body in the other direction, and spaced apart from the pin body, and a tip part integrated with the second extension portion and having an end sharply protruding upward from an outer upper end of the second extension portion, in which the second extension portion includes a plurality of elasticity provision holes formed in parallel with an outer peripheral surface of the second extension portion and having different shapes to provide an elastic force that moves a portion of a needle of the tip part.

## Claims

### Claim 1

A probe pin comprising:
a pin body including a plurality of holes and positioned at one side;
a first extension portion extending in a first direction upward from an outer side of the pin body;
a second extension portion elongated from an end of the first extension portion, extending further than the pin body along a second direction, and spaced apart from the pin body; and
a tip part integrated with the second extension portion and comprising an end sharply protruding upward along the first direction from an outer upper end of the second extension portion,
wherein the second extension portion includes a first elasticity provision hole and a second elasticity provision hole formed in parallel with an outer peripheral surface of the second extension portion and having different shapes to provide an elastic force that moves a portion of a needle of the tip part,
wherein the first elasticity provision hole has a thin elongated shape,
wherein the second elasticity provision hole is thicker than the first elasticity provision hole and formed above the first elasticity provision hole,
wherein the second elasticity provision hole is divided by a protruding portion formed on a front surface of the first extension portion,
wherein the tip part further comprises an alignment portion extending to be spaced apart from the needle, and
wherein the needle protrudes further from the second extension portion than the alignment portion.

### Claim 2 (depends on 1)

The probe pin of claim 1, further comprising:
a gripping part formed on an upper portion of the first extension portion so as to be gripped by a gripper.

### Claim 3 (depends on 2)

The probe pin of claim 2, wherein the gripping part is formed on the upper portion of the first extension portion and the second extension portion is provided at a lower portion of the gripping part so that the gripper grips the gripping part at an inner side of the pin body on which a bonding process is performed.

### Claim 4 (depends on 1)

The probe pin of claim 1, wherein the pin body protrudes toward the second extension portion and maintains rigidity.