Information processing system, information processing device, information processing method, and program
AssigneesJapan Aerospace Exploration Agency, Mitsubishi Electric Software Corporation
InventorsAtsushi Kanda, Yuji Satoh, Ippei Uchikata, Tomotaka Yamamoto
Life of this patent
Estimating the term…
Abstract
An information processing system includes an irradiation unit configured to irradiate a deposited material with electromagnetic waves, a detection unit configured to detect scattered waves or transmitted waves of the electromagnetic waves with which the deposited material has been irradiated by the irradiation unit, and a determination unit configured to determine a state of the deposited material from an image based on the scattered waves or the transmitted waves detected by the detection unit.
Claims13
An information processing system comprising:
- an irradiation unit configured to irradiate a deposited material with electromagnetic waves;
- a detection unit configured to detect scattered waves or transmitted waves of the electromagnetic waves with which the deposited material has been irradiated by the irradiation unit;
- a determination unit configured to determine a state of the deposited material from an image based on the scattered waves or the transmitted waves detected by the detection unit;
- and
- an extraction unit configured to extract a plurality of feature quantities from the image based on the scattered waves or the transmitted waves detected by the detection unit,
- wherein the determination unit is configured to input the plurality of feature quantities extracted by the extraction unit to a model which is learned to output a state quantity of a material when a plurality of feature quantities acquired from an image based on scattered waves or transmitted waves of electromagnetic waves with which the material has been irradiated are input to the model and to determine the state of the deposited material on the basis of output results from the model to which the plurality of feature quantities are input.
An information processing device comprising:
- an acquisition unit configured to acquire an image based on scattered waves or transmitted waves of electromagnetic waves with which a deposited material is irradiated;
- a determination unit configured to determine a state of the deposited material from the image acquired by the acquisition unit;
- and
- an extraction unit configured to extract a plurality of feature quantities from the image based on the scattered waves or the transmitted waves,
- wherein the determination unit is configured to input the plurality of feature quantities extracted by the extraction unit to a model which is learned to output a state quantity of a material when a plurality of feature quantities acquired from an image based on scattered waves or transmitted waves of electromagnetic waves with which the material has been irradiated are input to the model and to determine the state of the deposited material on the basis of output results from the model to which the plurality of feature quantities are input.
An information processing method performed by a computer, comprising:
- acquiring an image based on scattered waves or transmitted waves of electromagnetic waves with which a deposited material is irradiated;
- determining a state of the deposited material from the acquired image
- extracting a plurality of feature quantities from the image based on the scattered waves or the transmitted waves;
- inputting the plurality of feature quantities extracted by the extraction unit to a model which is learned to output a state quantity of a material when a plurality of feature quantities acquired from an image based on scattered waves or transmitted waves of electromagnetic waves with which the material has been irradiated are input to the model;
- and
- determining the state of the deposited material on the basis of output results from the model to which the plurality of feature quantities are input.
Dependencies are inferred from the claim text.