# US 12,000,035 B2 · Sanitary equipment part

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- Number: US 12,000,035 B2
- Document ID: US12000035B2
- Status: Granted
- Kind: B2
- Application number: 17/280,675
- Filed: 2021-03-01
- Published: 2023-01-19
- Granted: 2024-06-04
- Earliest claimed: 2020-03-31
- Assignees: Toto Ltd.
- Applicants: Toto Ltd.
- Inventors: Yui Noda; Saori Ukigai; Yuya Suzuki
- Web page: https://patentgrep.com/patent/US12000035B2

## CPC

- C23C 14/083: {of refractory metals or yttrium}
- B32B 9/00: Layered products comprising a {layer of a} particular substance not covered by groups B32B11/00 - B32B29/00
- B32B 9/005: {comprising one layer of ceramic material, e.g. porcelain, ceramic tile (layered products with at least two ceramic layers composed mainly of ceramic B32B18/00)}
- C09K 3/18: for application to surfaces to minimize adherence of ice, mist or water thereto (rendering particulate materials free flowing, in general, e.g. making them hydrophobic B01J2/30); Thawing or antifreeze materials for application to surfaces (used in liquids for heat-transfer, heat-exchange or heat-storage or for the production of heat or cold other than by combustion, e.g. radiator liquids, C09K5/00)
- C23C 14/0015: {characterized by the colour of the layer}
- C23C 14/0664: {Carbonitrides}
- C23C 14/34: Sputtering
- C23C 14/547: {using optical methods}
- C23C 28/00: Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
- E03C 1/042: Arrangements on taps for wash-basins or baths for connecting to the wall
- C23C: COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL (making metal-coated products by extrusion B21C23/22; covering with metal by connecting pre-existing layers to articles, see the relevant places, e.g. B21D39/00, B23K; metallising of glass C03C; metallising mortars, concrete, artificial stone, ceramics or natural stone C04B41/00; enamelling of, or applying a vitreous layer to, metals C23D; treating metal surfaces or coating of metals by electrolysis or electrophoresis C25D; single-crystal film growth C30B; by metallising textiles D06M11/83; decorating textiles by locally metallising D06Q1/04)
- B32B: LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- C09K: MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- E03C: DOMESTIC PLUMBING INSTALLATIONS FOR FRESH WATER OR WASTE WATER (not connected to either water-supply main or to waste pipe A47K; devices of the kind used in the ground E03B, E03F); SINKS

## Abstract

A part includes a base material, a colored layer on the base material, and a surface layer on the colored layer, wherein the colored layer contains Zr, and optionally, C and/or N, a ratio (HZr oxide/HZr) of a peak height derived from Zr oxide (HZr oxide) to a peak height of Zr (HZr) at an interface of the colored layer on the side of the surface layer is more than 0 and less than 4.5, the interface is a point where Zr is detected by sputtering the part from the side of the surface layer with an XPS depth direction analysis, and the ratio (HZr oxide/HZr) at a point where Ar sputtering is performed for 5 minutes from the interface of the colored layer on the side of the surface layer with the XPS depth direction analysis is 0 to less than 3. The surface layer is water-repellent and exhibits a sputtering time of 5 minutes or less.

## Claims

### Claim 1

A part comprising a base material, a colored layer on the base material, and a surface layer on the colored layer, wherein
the colored layer contains Zr and optionally, C and/or N,
a ratio HZr oxide/HZr of a peak height derived from Zr oxide HZr oxide to a peak height of Zr HZr at an interface of the colored layer on the side of the surface layer, in a profile obtained by an XPS depth direction analysis, is more than 0 and less than 4.5, the XPS depth direction analysis being performed under the following XPS measurement conditions and Sputtering conditions 1,
XPS measurement conditions
X-ray condition: monochromatic AlKα ray (output 25 W),
Photoelectron take-off angle: 45°,
Analysis area: 100 μmφ,
Charge neutralizer setting: 1.0 V, 10 μA,
Time per step: 50 ms,
Sweep: five times,
Pass energy: 112 eV, and
Element to be analyzed (energy range): Zr3d (177-187 eV), C1s (281-296 eV), N1s (394-406 eV), O1s (524-540 eV), Cr2p3 (572-582 eV), Ti2p (452-463 eV), Si2p (98-108 eV),
Sputtering conditions 1
Inert gas species: Ar,
Sputtering voltage: 500 V,
Sputtering range: 2 mm*2 mm, and
Sputtering cycle: 10 seconds, and
the ratio HZr oxide/HZr at a point where Ar sputtering is performed for 5 minutes from the interface of the colored layer on the side of the surface layer with an XPS depth direction analysis is between 0 or more and less than 3, the XPS depth direction analysis being performed under said XPS measurement conditions and the following Sputtering conditions 2,
Sputtering conditions 2
Inert gas species: Ar
Sputtering voltage: 500 V
Sputtering range: 2 mm*2 mm
Sputtering cycle: 1 minute; and
the surface layer
is water-repellent, and
includes a hydrophobic group, and
exhibits a sputtering time of 5 minutes or less, the sputtering time being a time taken from the start of the sputtering to an end point of the surface layer, and the end point being defined, in a profile obtained by an XPS depth direction analysis of the surface layer, as a point where an absolute value of a difference between a carbon atom concentration at a certain measurement point and a carbon atom concentration at an immediately previous measurement point to the certain measurement point is 1.0 at % or less, the XPS depth direction analysis being performed under said XPS measurement conditions and said Sputtering conditions 1.

### Claim 2 (depends on 1)

The part according to claim 1, wherein
the colored layer contains, at a point where Ar sputtering is performed for 5 minutes from the interface of the colored layer on the side of the surface layer with an XPS depth direction analysis,
15 at % or more to 65 at % or less of Zr,
10 at % or more to 40 at % or less of O,
25 at % or more to 45 at % or less of C and N, and
0 at % or more to 20 at % or less of a metal element (excluding Ti and Zr), on the proviso that
a total of a combination of the Zr, O, C and N, and the metal element (excluding Ti and Zr) is 100 at %, the XPS depth direction analysis being performed under said XPS measurement conditions and said Sputtering conditions 2.

### Claim 3 (depends on 1)

The part according to claim 1, wherein the colored layer comprises an oxide film with a thickness of less than 30 nm.

### Claim 4 (depends on 1)

The part according to claim 1, wherein
the surface layer
is a monolayer, and
has a sputtering time of 3 minutes or less, the sputtering time being a time taken from the start of the sputtering to an end point of the surface layer, and the end point being defined, in a profile obtained by an XPS depth direction analysis of the surface layer, as a point where an absolute value of a difference between a carbon atom concentration at a certain measurement point and a carbon atom concentration at an immediately previous measurement point to the certain measurement point is 1.0 at % or less, the XPS depth direction analysis being performed under said XPS measurement conditions and said Sputtering conditions 1.

### Claim 5 (depends on 1)

The part according to claim 1, wherein
the ratio HZr oxide/HZr of the peak height derived from Zr oxide HZr oxide to the peak height of Zr HZr at the interface of the colored layer on the side of the surface layer is 2 or more and 4 or less, and the ratio HZr oxide/HZr at the point where Ar sputtering is performed for 5 minutes from the interface of the colored layer on the side of the surface layer with an XPS depth direction analysis is between 0.5 or more and less than 1.5.

### Claim 6 (depends on 1)

The part according to claim 1, wherein
the colored layer contains, at a point where Ar sputtering is performed for 5 minutes from the interface of the colored layer on the side of the surface layer with an XPS depth direction analysis,
25 at % or more to 55 at % or less of Zr,
10 at % or more to 40 at % or less of O,
25 at % or more to 45 at % or less of C and N, and
0 at % or more to 10 at % or less of a metal element (excluding Ti and Zr), on the proviso that
a total of a combination of the Zr, O, C and N, and the metal element (excluding Ti and Zr) is 100 at %, the XPS depth direction analysis being performed under said XPS measurement conditions and said Sputtering conditions 2.

### Claim 7 (depends on 1)

The part according to claim 1, wherein the part is used as a faucet, or a part constituting a toilet, or a part constituting a bathroom.

### Claim 8 (depends on 2)

The part according to claim 2, wherein the colored layer comprises an oxide film with a thickness of less than 30 nm.

### Claim 9 (depends on 2)

The part according to claim 2, wherein
the surface layer
is a monolayer, and
has a sputtering time of 3 minutes or less, the sputtering time being a time taken from the start of the sputtering to an end point of the surface layer, and the end point being defined, in a profile obtained by an XPS depth direction analysis of the surface layer, as a point where an absolute value of a difference between a carbon atom concentration at a certain measurement point and a carbon atom concentration at an immediately previous measurement point to the certain measurement point is 1.0 at % or less, the XPS depth direction analysis being performed under said XPS measurement conditions and said Sputtering conditions 1.

### Claim 10 (depends on 2)

The part according to claim 2, wherein
the ratio HZr oxide/HZr of the peak height derived from Zr oxide HZr oxide to the peak height of Zr HZr at the interface of the colored layer on the side of the surface layer is 2 or more and 4 or less, and the ratio HZr oxide/HZr at the point where Ar sputtering is performed for 5 minutes from the interface of the colored layer on the side of the surface layer with an XPS depth direction analysis is between 0.5 or more and less than 1.5.

### Claim 11 (depends on 2)

The part according to claim 2, wherein
the colored layer contains, at a point where Ar sputtering is performed for 5 minutes from the interface of the colored layer on the side of the surface layer with an XPS depth direction analysis,
25 at % or more to 55 at % or less of Zr,
10 at % or more to 40 at % or less of O,
25 at % or more to 45 at % or less of C and N, and
0 at % or more to 10 at % or less of a metal element (excluding Ti and Zr), on the proviso that
a total of a combination of the Zr, O, C and N, and the metal element (excluding Ti and Zr) is 100 at %, the XPS depth direction analysis being performed under said XPS measurement conditions and said Sputtering conditions 2.

### Claim 12 (depends on 2)

The part according to claim 2, wherein the part is used as a faucet, or a part constituting a toilet, or a part constituting a bathroom.

### Claim 13 (depends on 3)

The part according to claim 3, wherein
the surface layer
is a monolayer, and
has a sputtering time of 3 minutes or less, the sputtering time being a time taken from the start of the sputtering to an end point of the surface layer, and the end point being defined, in a profile obtained by an XPS depth direction analysis of the surface layer, as a point where an absolute value of a difference between a carbon atom concentration at a certain measurement point and a carbon atom concentration at an immediately previous measurement point to the certain measurement point is 1.0 at % or less, the XPS depth direction analysis being performed under said XPS measurement conditions and said Sputtering conditions 1.

### Claim 14 (depends on 3)

The part according to claim 3, wherein
the ratio HZr oxide/HZr of the peak height derived from Zr oxide HZr oxide to the peak height of Zr HZr at the interface of the colored layer on the side of the surface layer is 2 or more and 4 or less, and the ratio HZr oxide/HZr at the point where Ar sputtering is performed for 5 minutes from the interface of the colored layer on the side of the surface layer with an XPS depth direction analysis is between 0.5 or more and less than 1.5.

### Claim 15 (depends on 3)

The part according to claim 3, wherein
the colored layer contains, at a point where Ar sputtering is performed for 5 minutes from the interface of the colored layer on the side of the surface layer with an XPS depth direction analysis,
25 at % or more to 55 at % or less of Zr,
10 at % or more to 40 at % or less of O,
25 at % or more to 45 at % or less of C and N, and
0 at % or more to 10 at % or less of a metal element (excluding Ti and Zr), on the proviso that
a total of a combination of the Zr, O, C and N, and the metal element (excluding Ti and Zr) is 100 at %, the XPS depth direction analysis being performed under said XPS measurement conditions and said Sputtering conditions 2.

### Claim 16 (depends on 4)

The part according to claim 4, wherein
the ratio HZr oxide/HZr of the peak height derived from Zr oxide HZr oxide to the peak height of Zr HZr at the interface of the colored layer on the side of the surface layer is 2 or more and 4 or less, and the ratio HZr oxide/HZr at the point where Ar sputtering is performed for 5 minutes from the interface of the colored layer on the side of the surface layer with an XPS depth direction analysis is between 0.5 or more and less than 1.5.

### Claim 17 (depends on 4)

The part according to claim 4, wherein
the colored layer contains, at a point where Ar sputtering is performed for 5 minutes from the interface of the colored layer on the side of the surface layer with an XPS depth direction analysis,
25 at % or more to 55 at % or less of Zr,
10 at % or more to 40 at % or less of O,
25 at % or more to 45 at % or less of C and N, and
0 at % or more to 10 at % or less of a metal element (excluding Ti and Zr), on the proviso that
a total of a combination of the Zr, O, C and N, and the metal element (excluding Ti and Zr) is 100 at %, the XPS depth direction analysis being performed under said XPS measurement conditions and said Sputtering conditions 2.

### Claim 18 (depends on 5)

The part according to claim 5, wherein
the colored layer contains, at a point where Ar sputtering is performed for 5 minutes from the interface of the colored layer on the side of the surface layer with an XPS depth direction analysis,
25 at % or more to 55 at % or less of Zr,
10 at % or more to 40 at % or less of O,
25 at % or more to 45 at % or less of C and N, and
0 at % or more to 10 at % or less of a metal element (excluding Ti and Zr), on the proviso that
a total of a combination of the Zr, O, C and N, and the metal element (excluding Ti and Zr) is 100 at %, the XPS depth direction analysis being performed under said XPS measurement conditions and said Sputtering conditions 2.