Electronic device test method and test device

A test device, for estimating the performance of a target electronic system, comprising:

• a storage device, configured to store at least one program;
• and
• a processing circuit, configured to execute the program to execute an electronic system test method comprising:
• (a) inputting a victim test pattern to a victim signal path of the target electronic system and simultaneously inputting at least one aggressor test pattern to at least one aggressor signal path of the target electronic system, according to a major set of test pattern comprising a plurality of minor set of test patterns;
• (b) acquiring an output response corresponding to the step (a);
• (c) after changing the victim test pattern or the aggressor test pattern, and after repeating the step (a) and the step (b) until all of the major test patterns set are used thereby acquiring a plurality of the output responses, determining a combination level according to the output responses;
• wherein the victim test pattern is an X bit pattern and the aggressor test pattern is a Y bit pattern, X and Y are positive integers larger than 3.