# US 11,994,535 B2 · Probe unit

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- Number: US 11,994,535 B2
- Document ID: US11994535B2
- Status: Granted
- Kind: B2
- Application number: 17/294,844
- Filed: 2019-11-26
- Published: 2022-01-20
- Granted: 2024-05-28
- Earliest claimed: 2018-11-27
- Assignees: NHK Spring Co., Ltd.
- Applicants: NHK Spring Co., Ltd.
- Inventors: Tsuyoshi Inuma; Shuji Takahashi
- Web page: https://patentgrep.com/patent/US11994535B2

## CPC

- G01R 1/07371: {using an intermediate card or back card with apertures through which the probes pass}
- G01R 1/06722: {Spring-loaded}
- G01R 1/06772: {High frequency probes}
- G01R 1/07314: {the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support (on an elastic support, e.g. a film, G01R1/0735)}
- G01R 31/2886: {Features relating to contacting the IC under test, e.g. probe heads; chucks (G01R31/2865 takes precedence, test connections, e.g. test sockets, or probes per se, G01R1/04 or G01R1/06)}
- H01R 33/76: Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)
- H01R: ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS

## Abstract

A probe unit includes: a first contact probe configured to come in contact with a signal electrode; a second contact probe configured to come in contact with a ground electrode; a probe holder including a first holder hole through which the first contact probe passes, and a second holder hole through which the second contact probe passes; and a conductive floating member including a first through hole to which the first contact probe is inserted and the signal electrode is inserted, and a second through hole to which the second contact probe is inserted and the ground electrode is inserted. The probe holder is configured such that at least an inner circumferential surface of the first holder hole has an insulating property, and the probe unit has a coaxial structure in which central axes of the first contact probe and the first through hole are aligned with each other.

## Claims

### Claim 1

A probe unit comprising:
a first contact probe configured to come in contact with a signal electrode provided on a contact target on one end side in a longitudinal direction;
a second contact probe configured to come in contact with a ground electrode provided on the contact target on one end side in a longitudinal direction;
a probe holder including:
a first holder hole through which the first contact probe passes, and
a second holder hole through which the second contact probe passes; and
a conductive floating member including:
a first through hole to which the one end of the first contact probe is inserted from one end side and the signal electrode is inserted from another end side, and
a second through hole to which the one end of the second contact probe is inserted from one end side and the ground electrode is inserted from another end side, a size of an opening of the second through hole being different from a size of an opening of the first through hole,
wherein the probe holder is configured such that at least an inner circumferential surface of the first holder hole has an insulating property,
the probe unit has a coaxial structure in which a central axis of the first contact probe and a central axis of the first through hole of the floating member are aligned with each other, and
wherein the conductive floating member is electrically connected to the second contact probe directly or indirectly.

### Claim 2 (depends on 1)

The probe unit according to claim 1, wherein a maximum diameter of the first through hole is larger than a maximum diameter of the second through hole.

### Claim 3 (depends on 2)

The probe unit according to claim 2, wherein
a tubular insulating member is provided on an inner circumferential surface of the first through hole, and
a diameter of an inner circumferential surface of the insulating member is equal to or less than a diameter of the second through hole.

### Claim 4 (depends on 1)

The probe unit according to claim 1, wherein the first through hole has a stepped shape having a diameter corresponding to the one end of the first contact probe and the signal electrode.

### Claim 5 (depends on 1)

The probe unit according to claim 1, wherein
the floating member includes a connection pin configured to position the floating member with respect to the probe holder, and
the probe holder includes:
an insulating main body including
the first holder hole, and
a partial holder hole forming a part of the second holder hole; and
a conductive member having conductivity, the conductive member including
a first hole that constitutes a part of the second holder hole, the second contact probe passing through the first hole, and
a second hole configured to house a part of the connection pin.