X-ray unit technology modules and automated application training

A scanner, comprising:

• an electromagnetic wave source;
• a detector in a position in the scanner to measure emissions from the electromagnetic wave source,
• a conveyor belt interposed between the electromagnetic wave source and the detector;
• wherein the detector comprises a first technology, and the detector is interchangeable with a replacement detector comprising a second technology, wherein the replacement detector is capable of being placed in the position of the detector in the scanner;
• a human machine interface to select the replacement detector for the detector, and
• a control system including one or more central processing units and a tangible non-transitory computer readable medium recognizes the replacement detector, and the tangible non-transitory computer readable medium stores operating parameters matched to the replacement detector.

A method for training a scanner to perform an inspection application, the method comprising:

• operating an electromagnetic wave source to generate electromagnetic wave emissions at a plurality of combinations of parameters;
• moving a conveyor belt to expose a product having a plurality of contaminants of different sizes to the electromagnetic wave emissions generated at more than one combination of parameters;
• recording attenuated electromagnetic wave emissions that pass through the product at more than one combination of parameters;
• and
• selecting a combination of parameters to use when inspecting a product for a contaminant.

A method for training a scanner to perform an inspection application, the method comprising:

• operating an electromagnetic wave source to generate electromagnetic wave emissions at a plurality of combinations of parameters;
• moving a conveyor belt to expose a conforming product to the electromagnetic wave emissions generated at more than one combination of parameters;
• recording attenuated electromagnetic wave emissions that pass through the conforming product at more than one combination of parameters;
• and
• selecting a combination of parameters to use when inspecting a product unknown to be conforming.