Lib anode coating measurement with dual x-ray
AssigneeHoneywell International Inc.
InventorsGertjan Job Hofman, Sebastien Tixier
Life of this patent
Estimating the term…
Abstract
A system includes a top scanner head configured over a coated substrate. An x-ray sensor and a second x-ray sensor scan the coated substrate. At least one of the x-ray sensor and second x-ray sensor is tuned to an energy level below an absorption peak and at least one of the x-ray sensor and second x-ray sensor is tuned to an energy level above the absorption peak. The x-ray sensor and second x-ray sensor scan a same sheet spot on the coated substrate. A bottom scanner head is configured underneath the coated substrate to provide a location for a detection of x-rays for the x-ray sensor and the second x-ray sensor.
Claims13
A system comprising:
- a computing device including a processor;
- a top scanner head configured above a coated substrate including a copper and a carbon-silicon coating;
- an x-ray sensor and a second x-ray sensor configured to scan the coated substrate, wherein at least one of the x-ray sensor and the second x-ray sensor is tuned to an energy below an absorption peak and the at least one of the x-ray sensor and the second x-ray sensor is tuned to an energy level above the absorption peak, and wherein the x-ray sensor and the second x-ray sensor scan a same sheet spot on the coated substrate;
- the processor within the computing device configured to calculate a basis weight for silicon and for copper in real-time based on the scanning of the sheet spot on the coated substrate while the x-ray sensors are operating;
- and
- a bottom scanner head configured underneath the coated substrate to provide a location for a detection of x-rays for the x-ray sensor and the second x-ray sensor.
A system comprising:
- a top scanner head configured at a first position;
- a computing device including a processor;
- a plurality of x-ray sensors configured to scan a sheet spot on a coated substrate including a copper and a carbon-silicon coating, wherein the plurality of x-ray sensors scan the sheet spot with at least one of the plurality of x-ray sensors tuned to an energy level below ten kiloelectron volts and at least one of the other of the plurality of x-ray sensors tuned to an energy level above ten kiloelectron volts, wherein the plurality of x-ray sensors scan photons of energy above and below ten kiloelectron volts;
- the processor within the computing device configured to calculate a basis weight for silicon and for copper in real-time based on the scanning of the sheet soot on the coated substrate while the x-ray sensors are operating;
- and
- a bottom scanner that receives the scanning of the plurality of x-ray sensors at a second position.
Dependencies are inferred from the claim text.