Monitoring mirror reflectance using solar illumination
AssigneeRaytheon Company
InventorStephen J. Schiller
Life of this patent
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AssigneeRaytheon Company
InventorStephen J. Schiller
Estimating the term…
A system (100) and method can monitor a reflectance of a mirror target that includes at least one curved mirror (M). The system (100) can take a first irradiance measurement of the sun (S), the first irradiance measurement representing a direct solar irradiance. The system (100) can take a second irradiance measurement that represents an irradiance from a reflection of the sun (S) from the mirror target plus background irradiance from a reflection of the sky from the mirror target. The system (100) can take a third irradiance measurement that represents the background irradiance from the reflection of the sky from the mirror target. The system (100) can determine a reflectance of the mirror target from the first, second, and third irradiance measurements. The system (100) can compare the reflectance to a specified reflectance threshold, and, upon determining that the reflectance of the mirror target is less than the specified reflectance threshold, can generate an alert signal.
A method for monitoring a reflectance of a mirror target that includes at least one curved mirror, the method comprising:
A system to measure a reflectance of a mirror target that includes at least one curved mirror, the system comprising:
A method for measuring a reflectance of a mirror target that includes at least one curved mirror, the method comprising:
Dependencies are inferred from the claim text.