Electronic apparatus performing self-test using self-test application and control method thereof
AssigneeSamsung Electronics Co., Ltd.
InventorsJaehoon Kim, Sungjun Kim, Kyuseon Son, Seunghee Shin, Myunggyun Yoon, Youngchang Lee
Life of this patent
Estimating the term…
Abstract
In an electronic apparatus, a processor executes a program stored in memory to perform essential functions. In the event of an error related to these functions, a self-test application is triggered. The processor may identify a relevant test routine from a set of routines, conduct tests on the function using the identified routine, and communicate the test results to a display. Accordingly, when an error occurs while the electronic apparatus is operating, the electronic apparatus can inform a user and a manufacturer of a cause of the error.
Claims11
An electronic apparatus comprising:
- a memory configured to store a program to perform at least one function;
- and
- at least one processor configured to:
- implement the at least one function of the electronic apparatus by executing the program stored in the memory,
- in response to occurrence of an error related to the function, execute a self-test application provided for a self-test of the error, and identify a test routine for the error among one or more test routines, wherein the test routine comprises a test criterion for the error, the test criterion reflecting a status of the electronic apparatus in a manufacturing stage,
- obtain a test result of the error by testing the function based on the test routine, and
- output information about the test result to a display.
A method of controlling an electronic apparatus, the method comprising:
- implementing at least one function of the electronic apparatus by executing a program stored in a memory;
- in response to occurrence of an error related to the function, executing a self-test application provided for a self-test of the error, and identifying a test routine for the error among one or more test routines, wherein the test routine comprises a test criterion for the error, the test criterion reflecting a status of the electronic apparatus in a manufacturing stage;
- obtaining a test result of the error by testing the function based on the test routine;
- and
- outputting information about the test result to be displayed.
Dependencies are inferred from the claim text.