Automatic analysis device
AssigneeHitachi High-Tech Corporation
InventorsKei Shioya, Hiroki Akase, Rei Konishi, Masaaki Sakaguchi
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AssigneeHitachi High-Tech Corporation
InventorsKei Shioya, Hiroki Akase, Rei Konishi, Masaaki Sakaguchi
Estimating the term…
When washing the inside of a reactor vessel which is used repeatedly, a rough suction is performed before suctioning with a washing tip; however, unwanted washing liquid may remain that may affect analysis results. The present invention provides an automatic analysis device for analyzing a sample using light, in which the automatic analysis device is characterized in that: a washing mechanism comprises a washing liquid supply nozzle that supplies washing liquid to a reactor vessel after analysis, a washing liquid suction nozzle that suctions the supplied washing liquid, a washing tip provided to the bottom end of the washing liquid suction nozzle, and a rough suction nozzle that suctions, in advance, a liquid within the reactor vessel before suctioning with the washing tip; and after the rough suction, liquid is caused to remain so that the bottom surface of the reactor vessel is not exposed.
An automatic analysis device comprising:
Dependencies are inferred from the claim text.