System and method for quantifying an exposure dose on surfaces
AssigneeB/E Aerospace, Inc.
InventorsThomas Martz, John D. Edquist, David C. McConnell, Steven Poteet, Katherine Urena Pimentel
Life of this patent
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AssigneeB/E Aerospace, Inc.
InventorsThomas Martz, John D. Edquist, David C. McConnell, Steven Poteet, Katherine Urena Pimentel
Estimating the term…
A method for quantifying an exposure dose for a surface is disclosed. The method may include emitting one or more beams of 222 nm light onto a portion of the surface using one or more far ultraviolet (UV) light sources capable of emitting 222 nm light, the portion of the surface being coated with one or more fluorescent coatings. The method may include capturing images of the portion of the surface. The method may include adjusting one or more image characteristics for the captured images using one or more filtering methods. The method may include generating a histogram of the adjusted images based on the one or more filtering methods. The method may include determining a pixel surface area for the generated histogram. The method may include calculating the exposure dose for the surface based on the generated pixel surface area and a predetermined calibration curve.
A system for quantifying an exposure dose on a surface, the system comprising:
A method for quantifying an exposure dose for a surface, the method comprising:
Dependencies are inferred from the claim text.