Method and apparatus for obtaining transmitter test parameter, and storage medium

An apparatus for obtaining a transmitter test parameter, the apparatus comprising:

• a processor, and
• a memory coupled to the processor, having processor-executable instructions stored thereon, which are executed by the processor and cause the processor to:
• perform waveform sampling on an optical signal sent by a transmitter, to obtain a sampled electrical signal,
• obtain a first noise amount associated with the sampled electrical signal based on a preset initial noise ratio parameter and a level amplitude of the sampled electrical signal,
• wherein the level amplitude of the sampled electrical signal is greater than a minimum level and less than a maximum level,
• wherein the initial noise ratio parameter is a ratio of a maximum noise amount to a minimum noise amount,
• wherein the maximum noise amount is a noise amount associated with an electrical signal at the maximum level,
• wherein the minimum noise amount is a noise amount associated with an electrical signal at the minimum level, and
• wherein the first noise amount is a noise amount that is greater than the minimum noise amount and less than the maximum noise amount;
• and
• obtain a second noise amount associated with an ideal electrical signal based on the initial noise ratio parameter, a first level amplitude of the ideal electrical signal and a second level amplitude of the ideal electrical signal,
• wherein an optical modulation amplitude of the ideal electrical signal equals to the optical modulation amplitude of the sampled electrical signal,
• wherein the first level amplitude of the ideal electrical signal is the maximum level, the second level amplitude of the ideal electrical signal is the minimum level, and
• wherein the first noise amount and the second noise amount are used to perform a consistency test on the transmitter.