Semiconductor chip providing on-chip self-testing of an ana-log-to-digital converter implemented in the semiconductor chip

#The present disclosure relates to on-chip self-testing of an Analog-to-Digital Converter (ADC). In particular, examples relate to a semiconductor chip providing on-chip self-testing of an ADC implemented in the semiconductor chip, a method for on-chip self-testing of an ADC, a receiver, a base station and a mobile device.

#Test time is a significant cost component in high volume manufacturing of ADCs. It conventionally requires an expensive and specialized Radio Frequency (RF) analog test set-up in a manufacturing test facility.

#Hence, there may be a desire for improved ADC testing.

#Some examples of apparatuses and/or methods will be described in the following by way of example only, and with reference to the accompanying figures, in which

#FIG. 1 illustrates a first example of a semiconductor chip providing on-chip self-testing of an ADC implemented in the semiconductor chip;

#FIG. 2 illustrates an example of a RF test signal;

#Various examples will now be described more fully with reference to the accompanying drawings in which some examples are illustrated. In the figures, the thicknesses of lines, layers and/or regions may be exaggerated for clarity.

#Accordingly, while further examples are capable of various modifications and alternative forms, some particular examples thereof are shown in the figures and will subsequently be described in detail. However, this detailed description does not limit further examples to the particular forms described. Further examples may cover all modifications, equivalents, and alternatives falling within the scope of the disclosure. Same or like numbers refer to like or similar elements throughout the description of the figures, which may be implemented identically or in modified form when compared to one another while providing for the same or a similar functionality.

#It will be understood that when an element is referred to as being “connected” or “coupled” to another element, the elements may be directly connected or coupled via one or more intervening elements. If two elements A and B are combined using an “or”, this is to be understood to disclose all possible combinations, i.e. only A, only B as well as A and B, if not explicitly or implicitly defined otherwise. An alternative wording for the same combinations is “at least one of A and B” or “A and/or B”. The same applies, mutatis mutandis, for combinations of more than two Elements.