Semiconductor device

A semiconductor device comprising a first memory element, a second memory element, a comparison circuit, and a current adjustment circuit,

• wherein the first memory element is configured to retain reference temperature information,
• wherein the second memory element comprises a capacitor and a first transistor comprising an oxide semiconductor in a first semiconductor layer,
• wherein the second memory element is configured to measure ambient temperature, and to retain the ambient temperature as ambient temperature information between one electrode of the capacitor and one of a source electrode and a drain electrode of the first transistor due to a resistance change of the oxide semiconductor,
• wherein the comparison circuit is configured to determine an operation of the current adjustment circuit by comparing the reference temperature information and the ambient temperature information, and
• wherein the current adjustment circuit is configured to supply a current to a secondary battery.