Charged particle beam device and operation method therefor
AssigneeHitachi High-Tech Corporation
InventorsTomoharu Nagashima, Kazuki Ikeda, Wen Li, Masashi Wada, Hajime Kawano
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AssigneeHitachi High-Tech Corporation
InventorsTomoharu Nagashima, Kazuki Ikeda, Wen Li, Masashi Wada, Hajime Kawano
Estimating the term…
When adjusting optical axes of a multi-beam charged particle beam device, because parameters of optical systems are inter-dependent, the time required to adjust the parameters increases. Thus, the present invention provides a charged particle beam device provided with an optical parameter setting unit for setting parameters of optical systems for emitting a plurality of primary charged particle beams to a sample, detectors for individually detecting a plurality of secondary charged particle beams discharged from the sample, a plurality of memories for storing signals detected by the detectors and converted into digital pixels in the form of images, evaluation value derivation units for deriving evaluation values of the primary charged particle beams from the images, and a GUI capable of displaying the images and receiving an input from a user, wherein the GUI displays the images and evaluation results based on the evaluation values and changes various optical parameters in real-time.
A charged particle beam device, comprising:
A charged particle beam device comprising:
An operation method for a charged particle beam device, the charged particle beam device including a GUI configured to display an image and receive an input from a user, the operation method comprising:
Dependencies are inferred from the claim text.