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US 11,961,578 B2Granted
Test device and test method thereof
AssigneeNanya Technology Corporation
InventorJyun-Da Chen
Life of this patent
Estimating the term…
Abstract
A memory device includes a data array, a parity array and an ECC circuit. The ECC circuit is coupled to the data array and the parity array. In a first test mode, the ECC function of the ECC circuit is disabled, and in a second test mode, the ECC circuit directly accesses the parity array to read or write parity information through the parity array.
Claims16
A test method for testing an error correction and checking (ECC) counter of a memory device, comprising:
- selecting one of a plurality of memory rows of the memory device to be a selected memory row, and making the selected memory row of the memory device to be a victim row;
- performing a plurality of error correction scrub (ECS) operations on the memory device;
- reading a plurality of mode registers to obtain an address of a recorded victim row after the ECS operation is performed;
- comparing the address of the recorded victim row with an address of the selected memory row to generate a test result;
- and
- determining a function of the ECC counter works normally in response to the test result indicating that the address of the recorded victim row obtained from the plurality of mode register matches the address of the selected memory row.
3 more elements
A test device, coupled to a memory device for testing an error correction and checking (ECC) counter, comprising:
- a controller, being configured to:
- select one of a plurality of memory rows of the memory device to be a selected memory row, and make the selected memory row of the memory device to be a victim row;
- perform a plurality of error correction scrub (ECS) operations on the memory device;
- read a plurality of mode registers to obtain an address of a recorded victim row after the ECS is performed;
- compare the address of the recorded victim row with an address of the selected memory row to generate a test result;
- and
- determine a function of the ECC counter works normally in response to the test result indicating that the address of the recorded victim row obtained from the plurality of mode register matches the address of the selected memory row.
4 more elements
Dependencies are inferred from the claim text.