Memory device and method of operating the same
AssigneeSK hynix Inc.
InventorsJong Woo Kim, Young Cheol Shin
Life of this patent
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AssigneeSK hynix Inc.
InventorsJong Woo Kim, Young Cheol Shin
Estimating the term…
The present technology relates to an electronic device. According to the present technology, a memory device having improved verify accuracy may include a memory block including memory cells, a read and write circuit including a plurality of page buffers, a current sensing circuit configured to perform a verify operation of comparing sensing voltages with a reference voltage, and a control logic configured to control the current sensing circuit to perform the verify operation. The control logic controls performing a first verify operation on each of page buffer groups having a same logical group number, and performing a second verify operation on each of page buffer groups having a same physical group number, and the current sensing circuit outputs a verify pass signal in response to both results of the first verify operation and the second verify operation satisfying a pass criterion.
A memory device comprising:
A method of operating a memory device comprising a read and write circuit including a plurality of page buffers respectively connected to memory cells included in a memory block through a plurality of bit lines, a current sensing circuit configured to perform a verify operation of comparing sensing voltages received from the plurality of page buffers with a reference voltage corresponding to an error correctable bit number, and a control logic configured to group the plurality of page buffers into a plurality of page buffer groups, and control the current sensing circuit to perform the verify operation for each of the plurality of page buffer groups, the method comprising:
Dependencies are inferred from the claim text.