Output impedance calibration, and related devices, systems, and methods
AssigneeMicron Technology, Inc.
InventorHyunui Lee
Life of this patent
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AssigneeMicron Technology, Inc.
InventorHyunui Lee
Estimating the term…
A device may include a number of drivers, wherein each driver of the number of drivers includes a number of transistors coupled to an output node. The device may further include circuitry coupled to the number of drivers. The circuitry may configure at least one driver of the number of drivers in each of a number of configurations, wherein each configuration of the number of configurations is associated with a calibration code of a number of calibration codes. Each configuration generates, in response to signal transmission via the output node, an associated channel performance response of a number of channel performance responses. The circuitry may also store a calibration code for the at least one unit driver, wherein the calibration code generates a desired channel performance response of the number of channel performance responses. Systems and related methods of operation are also described.
A device, comprising:
A system, comprising:
A system, comprising:
A method, comprising:
Dependencies are inferred from the claim text.