Wafer searching method and device

A wafer searching device, comprising:

• a storage circuit for storing a program code;
• and
• a processor coupled to the storage circuit and accessing the program code for executing the following:
• obtaining a target wafer and a reference wafer, wherein a plurality of failed dies and a plurality of normal dies are distributed on the target wafer and the reference wafer, respectively, the target wafer is divided into a plurality of first areas, and the reference wafer is divided into a plurality of second areas corresponding to the first areas;
• determining a first specific area in the first areas and obtaining a first significant distribution feature of fail patterns of the failed dies in the first specific area;
• determining at least one second specific area in the second areas and obtaining a second significant distribution feature of fail patterns of the failed dies in each second specific area;
• in response to determining that the first significant distribution feature corresponds to any one of the second significant distribution features of the at least one second specific area, estimating a fail pattern similarity between the first specific area and the each second specific area;
• in response to determining that the fail pattern similarity is greater than a similarity threshold, providing the reference wafer as a search result corresponding to the target wafer.