Test program generation method, device, memory medium and electronic equipment

A device for generating a test program configured to test a memory, the device comprising:

• an information acquiring module, configured to acquire configuration information of the memory and a test logic for the memory;
• a component acquiring module, configured to determine, according to the test logic, at least one type of test program components from a preset test program component library;
• a component combining module, configured to acquire a test program according to the configuration information by combining a plurality of the test program components, wherein types of the plurality of test program components are included in the determined at least one type of test program components;
• a timing acquiring module, configured to acquire timing interval information corresponding to the test logic;
• and
• a timing adjustment module, configured to adjust, based on the timing interval information, timing intervals among the plurality of test program components in the test program.

A non-transitory computer readable storage medium storing a computer program, wherein the computer program is executed by a processor to perform operations including:

• acquiring configuration information of the memory and a test logic for the memory;
• determining, according to the test logic, at least one type of test program components from a preset test program component library;
• and
• acquiring a test program according to the configuration information by combining a plurality of test program components, wherein types of the plurality of test program components are included in the determined at least one type of test program components, wherein after acquiring the test program according to the configuration information by combining the plurality of the test program components, the method further comprises:
• acquiring timing interval information corresponding to the test logic;
• and
• adjusting, based on the timing interval information, timing intervals among the plurality of test program components in the test program.

An electronic equipment, comprising:

• a processor;
• a computer readable storage medium, configured to store executable instructions for the processor;
• wherein the processor is configured to execute the executable instructions and to perform operations including:
• acquiring configuration information of the memory and a test logic for the memory;
• determining, according to the test logic, at least one type of test program components from a preset test program component library;
• and
• acquiring a test program according to the configuration information by combining a plurality of test program components, wherein types of the plurality of test program components are included in the determined at least one type of test program components, wherein after acquiring the test program according to the configuration information by combining the plurality of the test program components, the method further comprises:
• acquiring timing interval information corresponding to the test logic;
• and
• adjusting, based on the timing interval information, timing intervals among the plurality of test program components in the test program.