Anti-glare film and image display device
AssigneeDai Nippon Printing Co., Ltd.
InventorsMitsuhiro Kuzuhara, Yukimitsu Iwata, Jun Tsujimoto, Shigeki Murakami, Gen Furui
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Abstract
Provided is an anti-glare film excellent in anti-glare properties and capable of suppressing reflected scattered light. The anti-glare film includes an anti-glare layer, the anti-glare film having an uneven surface, wherein for an amplitude spectrum of elevation of the uneven surface, when a sum of amplitudes corresponding to spatial frequencies of 0.005 μm−1, 0.010 μm−1, and 0.015 μm−1 is defined as AM1 and an amplitude at a spatial frequency of 0.300 μm−1 is defined as AM2, AM1 is 0.070 μm or more and 0.400 μm or less, AM2 is 0.0050 μm or more, and AM2<AM1.
Claims14
An anti-glare film comprising an anti-glare layer, the anti-glare film having an uneven surface, wherein a smoothed reflected light intensity measured under the following measurement conditions satisfies the following conditions 1 and 2, wherein the uneven surface has a three-dimensional mean peak interval Smp of 2.524 μm or more and 8.228 μm or less,
- <measurement conditions>
- (1) in a transmission measurement mode of a goniophotometer, a visible light beam is emitted as a parallel light beam from a light source of the goniophotometer, an intensity of the emitted light is measured at an aperture angle of 1 degree without passing through a sample, and standardization is performed so that the maximum intensity is 100,000;
- (2) a black plate is bonded to a surface opposite to the uneven surface of the anti-glare film via a transparent adhesive layer to produce a sample α in which the anti-glare film, the transparent adhesive layer, and the black plate are laminated and which has the uneven surface;
- (3) the sample α is placed in the goniophotometer, the uneven surface of the sample α is irradiated with a visible light beam as a parallel light beam from the light source of the goniophotometer, and a reflected light intensity is measured at an aperture angle of 1 degree, wherein an irradiation angle of the parallel light beam is set to a direction inclined by +45 degrees from a normal direction of the sample α, the reflected light intensity is measured at intervals of 1 degree from 0 degrees, which is the normal direction of the sample α, to −85 degrees, and in order to maintain effects of standardization in (1), the reflected light intensity is measured in the transmission measurement mode;
- and
- (4) a smoothing process represented by the following formula (i) is performed at each angle from 0 degrees to −85 degrees, and the reflected light intensity after the smoothing process is defined as the smoothed reflected light intensity at each angle:
- n−degree smoothed reflected light intensity=([n−2-degree reflected light intensity]+[n−1-degree reflected light intensity]+[n−degree reflected light intensity]+[n+1-degree reflected light intensity]+[n+2-degree reflected light intensity])/5 (i)
- <condition 1>
- when the n-degree smoothed reflected light intensity is defined as Rn, and the n−1-degree smoothed reflected light intensity is defined as Rn−1, a maximum absolute value of difference between Rn and Rn−1 is 2.00 or less, and
- <condition 2>
- the smoothed reflected light intensity at −35 degrees is 0.1 or more and 4.0 or less.
Dependencies are inferred from the claim text.