Optical measurement device and optical measurement method
AssigneeDai Nippon Printing Co., Ltd.
InventorsMakio Kurashige, Kazutoshi Ishida, Shumpei Nishio
Life of this patent
Estimating the term…
Loading patent…
AssigneeDai Nippon Printing Co., Ltd.
InventorsMakio Kurashige, Kazutoshi Ishida, Shumpei Nishio
Estimating the term…
An optical measurement device includes an optical system that focuses emitted light that is emitted from a measurement surface of a light emitting electronic display or a light emitting surface of which a speckle contrast or a sparkle contrast is to be measured; a two-dimensional sensor array having a two-dimensional sensor array surface on which the emitted light is focused, the two-dimensional sensor array capturing an image of the emitted light; and a calculation unit that calculates the speckle contrast or the sparkle contrast based on the image of the emitted light captured under an imaging condition under which a size of a light-emitting region on the measurement surface is constant, the light-emitting region contributing to formation of a diffraction limited spot of the emitted light on the two-dimensional sensor array surface.
An optical measurement device comprising:
An optical measurement method comprising the steps of:
Dependencies are inferred from the claim text.