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US 11,959,963 B2Granted
Integrity tests for mixed analog digital systems
AssigneeAptiv Technologies AG
InventorsOlaf Donner, Tammo Kunnert
Life of this patent
Estimating the term…
Abstract
Device for checking the integrity of a digital transmission for an analog output of a system. The analog output may be checked for transient errors that can be attributed to a digital transmission path embedded somewhere within the vehicle system. A test signal is introduced into a digital transmission that can be reassembled from an analog path of the analog output, and, if not, allows the test device to pinpoint that errors are appearing due to the digital path, and not because of the analog output. In this way, debugging an installation of a system becomes easier; obtaining confidence in reliability of a mixed analog and digital system becomes less of a challenge and less time consuming.
Claims20
A vehicle system comprising:
- a device under test comprising:
- a source configured to produce a digital transmission;
- a first test signal generator (TSG) configured to:
- produce a first test signal based on a test generation function;
- and
- inject the first test signal into the digital transmission;
- a digital path configured to transfer the digital transmission from the first TSG to an analog output of the device under test;
- and
- the analog output configured to output an analog response along an analog path based on the digital transmission;
- and
- a test device comprising:
- at least one processor configured to:
- receive, from the device under test, the analog response;
- receive, from a second TSG of the test device, a second test signal based on the test generation function;
- compensate the second test signal using a linear transfer function of a combination of the digital path and the analog path of the device under test to produce an estimated test signal;
- determine whether the estimated test signal is identifiable from the analog response;
- and
- output an indication of whether any errors have been introduced by the digital path of the device under test based on whether the estimated test signal is identifiable from the analog response.
15 more elements
A method comprising:
- producing, by a source of a device under test, a digital transmission;
- producing, by a first test signal generator (TSG) of the device under test, a first test signal based on a test generation function;
- injecting, by the first TSG of the device under test, the first test signal into the digital transmission;
- transmitting, via a digital path of the device under test that is between the first TSG of the device under test and an analog output of the device under test, the digital transmission to the analog output of the device under test;
- outputting, by the analog output of the device under test and via an analog path, an analog response based on the digital transmission;
- receiving, by at least one processor of a test device, the analog response from the device under test;
- receiving, by the processor of the test device and from a second TSG of the test device, a second test signal based on the test generation function;
- compensating, by the processor of the test device, the second test signal using a linear transfer function of a combination of the digital path and the analog path of the device under test to produce an estimated test signal;
- determining, by the processor of the test device, whether the estimated test signal is identifiable from the analog response;
- and
- outputting, by the processor of the test device, an indication of whether any errors have been introduced by the digital path of the device under test based on whether the estimated test signal is identifiable from the analog response.
8 more elements
A test device comprising:
- at least one processor configured to:
- receive, from an analog path of a device under test, an analog response, a portion of the analog response corresponding to a first test signal that has been introduced into a digital transmission that has been propagated along a digital path of the device under test and converted to analog to form the analog response;
- receive a second test signal that is formed by the test device based on a test generation function that is also used, by the device under test, to generate the first test signal;
- compensate the second test signal using a linear transfer function of a combination of the digital path and an analog path of the device under test to produce an estimated test signal;
- determine whether the estimated test signal is identifiable from the analog response;
- and
- output an indication of whether any errors have been introduced by the digital path of the device under test based on whether the estimated test signal is identifiable from the analog response.
4 more elements
Dependencies are inferred from the claim text.