Test device and test method thereof
AssigneeYungu (Gu'an) Technology Co., Ltd.
InventorZhaoyang Xi
Life of this patent
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Abstract
Disclosed are a test device and a test method thereof. The test device includes a first electrode, an electron transport unit, a charge generation layer, a hole transport unit and a second electrode which are stacked; the charge generation layer includes an N-type doped layer and a P-type doped layer which is stacked on the N-type doped layer, the N-type doped layer is adjacent to the electron transport unit, and the P-type doped layer is adjacent to the hole transport unit.
Claims20
A test device, comprising a first electrode, an electron transport unit, a charge generation layer, a hole transport unit and a second electrode which are stacked;
- and
- wherein the charge generation layer comprises an N-type doped layer and a P-type doped layer which are stacked, the N-type doped layer is adjacent to the electron transport unit, and the P-type doped layer is adjacent to the hole transport unit;
- wherein the electron transport unit is directly attached between the first electrode and the charge generation layer, the charge generation layer is directly attached between the electron transport unit and the hole transport unit, and the hole transport unit is directly attached between the second electrode and the charge generation layer.
A test device, comprising a first electrode, an electron transport unit, a charge generation layer, a hole transport unit and a second electrode which are stacked;
- and
- wherein the charge generation layer comprises an N-type doped layer and a P-type doped layer which are stacked, the N-type doped layer is adjacent to the electron transport unit, and the P-type doped layer is adjacent to the hole transport unit;
- wherein the first electrode is an anode and the second electrode is a cathode, the charge generation layer is configured to generate a first internal current when a test voltage applied between the first electrode and the second electrode is a forward voltage, to allow drawing a voltage-current curve according to the first internal current varying with the forward voltage;
- or
- wherein the first electrode is a cathode and the second electrode is an anode, the charge generation layer is configured to generate a second internal current when a test voltage applied between the first electrode and the second electrode is a reverse voltage, to allow drawing a voltage-current curve according to the second internal current varying with the reverse voltage.
Dependencies are inferred from the claim text.