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US 11,953,519 B2Granted
Modular automated test system
AssigneeTeradyne, Inc.
InventorsChristopher James Bruno, Philip Luke Campbell, Adnan Khalid, Evgeny Polyakov, John Patrick Toscano
Life of this patent
Estimating the term…
Abstract
An example test system includes packs. The packs include test sockets for testing devices under test (DUTs) and at least some test electronics for performing tests on the DUTs in the test sockets. Different packs are configured to have different configurations. The different configurations include at least different numbers of test sockets arranged at different pitches.
Claims28
A test system comprising:
- packs, each pack comprising:
- test sockets for testing devices under test (DUTs);
- and
- at least some test electronics for performing tests on the DUTs in the test sockets, the test electronics being different from the DUTs;
- where the at least some test electronics comprises at least one of:
- pin electronics, a parametric measurement unit, logic circuitry, or a processing device, and
- where different packs are configured to have different configurations, the different configurations comprising at least different numbers of test sockets arranged at different pitches.
4 more elements
A test system comprising:
- packs comprising:
- test sockets for testing devices under test (DUTs);
- and
- at least some test electronics for performing tests on the DUTs in the test sockets, where different packs are configured to have different configurations, the different configurations comprising at least different numbers of test sockets arranged at different pitches;
- a cool atrium that houses the test sockets and that is supplied with cooled air;
- and
- a warm atrium arranged to receive air from the cool atrium that has been warmed as a result of testing the DUTs.
4 more elements
A test system comprising:
- packs comprising:
- test sockets for testing devices under test (DUTs);
- and
- at least some test electronics for performing tests on the DUTs in the test sockets, where different packs are configured to have different configurations, the different configurations comprising at least different numbers of test sockets arranged at different pitches;
- an ionized air supply;
- and
- one or more fans to move ionized air from the ionized air supply over at least some of the test sockets.
4 more elements
Dependencies are inferred from the claim text.