Switching matrix system and operating method thereof for semiconductor characteristic measurement
AssigneeStar Technologies Inc.
InventorsChoon Leong Lou, Hsiao Hui Hsieh, Li Min Wang
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Abstract
The present disclosure provides a switching matrix system and an operating method thereof for semiconductor characteristic measurement. The switching matrix system is configured to: detect an assembly of at least one switching matrix module inserted into a plurality of slots of the switching matrix system; determine a user interface according to the assembly of the at least one switching matrix module inserted into the slots, wherein the user interface includes an operable object corresponding to the assembly; and provide the user interface.
Claims20
A switching matrix system for semiconductor characteristic measurement, comprising:
- a plurality of slots configured for receiving at least one switching matrix module;
- a controller, electrically connected to the slots;
- and
- a storage unit, electrically connected to the controller for storing a program that, when executed, causes the controller to:
- detect an assembly of the at least one switching matrix module inserted into the slots;
- determine a user interface according to the assembly of the at least one switching matrix module inserted into the slots, wherein the user interface includes at least one operable object corresponding to the assembly;
- and
- provide the user interface.
An operating method of a switching matrix system, comprising:
- detecting, by the switching matrix system, an assembly of at least one switching matrix module inserted into a plurality of slots of the switching matrix system;
- determining, by the switching matrix system, a user interface according to the assembly of the at least one switching matrix module inserted into the slots, wherein the user interface includes an operable object corresponding to the assembly;
- and
- providing, by the switching matrix system, the user interface.
Dependencies are inferred from the claim text.