Item inspection by dynamic selection of projection angle
AssigneesUniversiteit Antwerpen, Imec Vzw
InventorsJan De Beenhouwer, Jan Sijbers
Life of this patent
Estimating the term…
Abstract
A method is provided for inspection of an item comprising acquiring a projection image of the item using a radiation imaging system and obtaining a plurality of simulated projection images of the item or a component thereof, based on a simulation of a numerical three-dimensional model. A relative orientation of the item with respect to the imaging system is determined by comparing the projection image to the plurality of simulated images, and at least one angle of rotation is determined by taking into account a viewing angle and the relative orientation. The method further comprises moving the item and/or the imaging system in accordance with the at least one angle of rotation and acquiring a further projection image of the item.
Claims20
A non-destructive method (1) for inspection of an item, the method comprising:
- acquiring (2) a projection image of the item using a radiation imaging system;
- obtaining (3) a plurality of simulated projection images of the item or at least one component thereof, based on a simulation of a numerical three-dimensional model of the item or the at least one item component, in which at least one geometric parameter relating to the relative orientation between the simulated item, a simulated radiation source, and a simulated detection plane varies over the plurality of simulated projection images;
- determining (4) a relative orientation of the item with respect to the radiation imaging system, said determining of the relative orientation comprising comparing (9) the acquired projection image to the plurality of simulated projection images, and selecting at least one simulated projection image with the highest image similarity measure to the projection image;
- determining (5) at least one angle of rotation taking a viewing angle and the relative orientation with respect to the selected simulated projection image into account;
- moving (6) the item and/or the radiation imaging system in accordance with the at least one angle of rotation;
- acquiring (7) a further projection image of the item, after moving the item and/or the radiation imaging system, such that the further projection image corresponds to a view of the item from the viewing angle.
A system (20) for inspection of an item, the system comprising:
- a radiation imaging system (21) for acquiring a projection image of the item;
- a simulator or a precomputed library (22), for providing a plurality of simulated projection images of the item or at least one component thereof, based on a simulation of a numerical three-dimensional model of the item or the at least one item component, in which at least one geometric parameter relating to the relative orientation between the simulated item, a simulated radiation source, and a simulated detection plane varies over the plurality of simulated projection images;
- a processor (23), such as a graphical processing unit, for determining a relative orientation of the item with respect to the radiation imaging system, in which determining the relative orientation comprises comparing the projection image to the plurality of simulated projection images, and selecting at least one simulated projection image with the highest image similarity measure to the projection image, said processor furthermore being adapted for determining at least one angle of rotation taking a viewing angle and the determined relative orientation with respect to the selected simulated projection image into account;
- an actuator (24), controlled by said processor, for moving the item and/or the radiation imaging system in accordance with the determined at least one angle of rotation such as to position and/or orient the item and/or the radiation imaging system with respect to each other to acquire a further projection image of the item corresponding to a view of the item from the viewing angle.
Dependencies are inferred from the claim text.