Three-dimensional measurement device

A three-dimensional measurement device, comprising:

• an illumination system (I);
• and
• an imaging system (II),
• wherein the illumination system (I) comprises, along an illumination light path, an N-color light source (8), a light beam shaping apparatus (7), a pattern modulation apparatus (6), and a projection lens (2), wherein the pattern modulation apparatus (6) is a N-spectrum pattern modulation apparatus and is configured to form a coded pattern comprising N spectral channels, the light beam shaping apparatus (7) is configured to shape light emitted by the light source (8) into near-parallel light, and the projection lens (2) is configured to project the coded pattern onto a target object;
• and
• wherein the imaging system (II) comprises, along an imaging optical path, an imaging lens (3), a first beam-splitting system, and an image sensor group comprising N image sensors, wherein the first beam-splitting system is configured to transmit the coded pattern projected onto the target object (1) and received by the imaging lens (3) to the N image sensors of the image sensor group, to form N image signals,
• wherein the illumination system (I) further comprises a texture image sensor (4) and a second beam-splitting system, the second beam-splitting system is located on the illumination light path and configured to enable the texture image sensor (4) to acquire a surface image signal of the target object (1).