Characterization device for characterizing the quality of light beams reflected from a surface of a reflective element and method therefor
AssigneeFundacióN Cener-Ciemat
InventorsIñigo Les Aguerrea, Amaia Mutuberria Larrayoz, Adrian Peña Lapuente, Marcelino Sanchez Gonzalez, Carlos Heras Vila, Iñigo Salina Áriz, David Izquierdo Núñez, Javier Garcia-Barberena Labiano
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