Optical film-thickness measuring apparatus and polishing apparatus
AssigneeEbara Corporation
InventorsMasaki Kinoshita, Toshifumi Kimba, Yoshikazu Kato, Yoichi Shiokawa
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AssigneeEbara Corporation
InventorsMasaki Kinoshita, Toshifumi Kimba, Yoshikazu Kato, Yoichi Shiokawa
Estimating the term…
An optical film-thickness measuring apparatus capable of eliminating an influence of a fluid flow on optical fiber cables when the fluid, such as pure water, is flowing through a through-hole of a polishing pad, and capable of achieving highly accurate measuring of a film thickness is disclosed. The optical film-thickness measuring apparatus includes: a light-emitting optical fiber cable coupled to a light source; a light-receiving optical fiber cable arranged to receive light reflected from the workpiece; a cable housing surrounding the light-emitting optical fiber cable and the light-receiving optical fiber cable; and a flow-passage structure defining a fluid passage adjacent to the light-emitting optical fiber cable and the light-receiving optical fiber cable. The light-emitting optical fiber cable and the light-receiving optical fiber cable are supported by at least one of the cable housing and the flow-passage structure.
An optical film-thickness measuring apparatus to be installed in a polishing apparatus for a workpiece, comprising:
An optical film-thickness measuring apparatus to be installed in a polishing apparatus for a workpiece, comprising:
An optical film-thickness measuring apparatus to be installed in a polishing apparatus for a workpiece, comprising:
Dependencies are inferred from the claim text.