Ocular aberrometer characterization systems and methods
AssigneeAlcon Inc.
InventorsMax Hall, Thomas Padrick, Edwin Jay Sarver
Life of this patent
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AssigneeAlcon Inc.
InventorsMax Hall, Thomas Padrick, Edwin Jay Sarver
Estimating the term…
Techniques are disclosed for systems and methods to provide improved ocular aberrometry. An ocular aberrometry system includes a wavefront sensor configured to provide wavefront sensor data associated with an optical target monitored by the ocular aberrometry system and a logic device configured to communicate with the wavefront sensor. The logic device is configured to determine a complex analysis engine for the ocular aberrometry system based, at least in part, on an aberrometer model and/or an eye model associated with the ocular aberrometry system, wherein the aberrometer model and the eye model are based, at least in part, on wavefront sensor data provided by the wavefront sensor. The logic device is also configured to generate a compact analysis engine for the ocular aberrometry system based, at least in part, on the determined complex analysis engine.
An ocular aberrometry system comprising:
A method comprising:
Dependencies are inferred from the claim text.