Semiconductor x-ray detector

An apparatus suitable for detecting X-ray, comprising:

• an X-ray absorption layer comprising an electrode;
• an electronics layer comprising:
• a first voltage comparator configured to compare a voltage of the electrode to a first threshold;
• a second voltage comparator configured to compare the voltage to a second threshold;
• a counter configured to register a number of X-ray photons absorbed by the X-ray absorption layer;
• a controller;
• wherein the controller is configured to start a time delay from a time at which the first voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the first threshold;
• wherein the controller is configured to activate the second voltage comparator during the time delay;
• wherein the controller is configured to cause the number registered by the counter to increase by one, if the second voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the second threshold;
• and
• a wall in a space among electrical connections between the X-ray absorption layer and the electronics layer;
• wherein the space has a non-uniform filling with a filler material.