Non-destructive pattern identification at a memory device
AssigneeMicron Technology, Inc.
InventorsYuan He, Takamasa Suzuki
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AssigneeMicron Technology, Inc.
InventorsYuan He, Takamasa Suzuki
Estimating the term…
Methods, systems, and devices for non-destructive pattern identification at a memory device are described. A memory device may perform pattern identification within the memory device and output a flag indicating whether a first data pattern matches with a second data pattern. The memory device may access one or more memory cells, via a word line, and latch the second data pattern of the memory cells to a sense amplifier. The memory device may deactivate the word line, which may result in isolating the memory cells from potential destruction of data. The memory device may write a first data pattern to the sense amplifier and compare the first data pattern and second data pattern at the sense amplifier. The memory device may output a signal indicating whether the data patterns match.
A method, comprising:
An apparatus, comprising:
An apparatus, comprising:
Dependencies are inferred from the claim text.