Abnormality detection circuit and abnormality detection method
AssigneeSeiko Epson Corporation
InventorToshihiko Katayama
Life of this patent
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AssigneeSeiko Epson Corporation
InventorToshihiko Katayama
Estimating the term…
An abnormality detection circuit includes a first voltage detection circuit to which a voltage is applied from an AC power source when a first relay contact is closed and a second voltage detection circuit to which a voltage is applied from the AC power source when a second relay contact is closed. One end of the first voltage detection circuit is connected to the AC power source via the second wiring line while passing through no other switch. One end of the second voltage detection circuit is connected to the AC power source via the first wiring line while passing through no other switch. Abnormalities of the first and second relay contacts are detected by comparing the voltage applied to a comparative voltage detection circuit with each of the voltages applied to the first and second voltage detection circuits, respectively.
An abnormality detection circuit comprising:
An abnormality detection circuit comprising:
An abnormality detection method of a circuit, the circuit including:
Dependencies are inferred from the claim text.