Using scan chains to read out data from integrated sensors during scan tests

A device comprising:

• logic circuits that implement logic functions;
• and
• sensor blocks that measure operating conditions for the logic circuits, wherein the sensor blocks are interconnected to form one or more sensor scan chains for shifting out sensor data based on the measurements of the operating conditions;
• and
• wherein the logic circuits and the sensor blocks are integrated onto a semiconductor died and at least some of the sensor blocks further comprise a sensor clock that clocks the measurement of operating conditions, a different scan clock that clocks the sensor scan chains, and a clock domain crossing between the sensor clock and the scan clock.

A non-transitory computer readable medium comprising stored instructions, which when executed by an automated testing system, cause the automated testing system to:

• run scan tests on devices under test (DUTs), each DUT comprising an integrated circuit that contains (a) logic circuits that implement logic functions, and (b) sensor blocks that capture measurements of operating conditions for the logic circuits;
• wherein the scan tests comprise:
• applying scan test stimuli to the DUT;
• receiving resulting scan test data from the logic circuits and corresponding sensor data from the sensor blocks;
• wherein the scan tests are controlled according to a scan enable signal that defines a shift period and a capture period;
• during the capture period, the scan test data is captured by logic scan chains and the sensor data is captured by sensor scan chains;
• and, during the shift period, the scan test data is shifted out through the logic scan chains and the sensor data is shifted out through the sensor scan chains;
• and
• improve testing of the DUTs based on the sensor data corresponding to the scan test data.