System and method for correcting optical path length measurement errors
AssigneeTokyo Electron Limited
InventorsKenji Nagai, Hideaki Nagasaki
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AssigneeTokyo Electron Limited
InventorsKenji Nagai, Hideaki Nagasaki
Estimating the term…
A system includes a first optical unit that emits light to a measurement target object and receives first interference light incident from the measurement target object, a second optical unit that emits the light to a reference object configured to have a constant optical path length with respect to a temperature fluctuation and receives second interference light incident from the reference object, a spectroscope connected to the first optical unit and the second optical unit and receives the first interference light and the second interference light to be incident, and a control unit connected to the spectroscope, and the control unit calculates a fluctuation rate of a measurement optical path length with respect to a reference optical path length under a predetermined temperature environment on the basis of the optical path length of the reference object calculated on the basis of the second interference light incident on the spectroscope under the predetermined temperature environment, and the reference optical path length of the reference object acquired in advance, and corrects, on the basis of the fluctuation rate, the optical path length of the measurement target object calculated on the basis of the first interference light incident on the spectroscope under the predetermined temperature environment.
A system for correcting an optical path length measurement error, the system comprising:
A method of correcting an optical path length measurement error, the method comprising:
Dependencies are inferred from the claim text.