Apparatuses and methods for calibrating adjustable impedances of a semiconductor device
OwnerDean Gansinventor
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Abstract
Apparatuses and methods for calibrating adjustable impedances of a semiconductor device are disclosed in the present application. An example apparatus includes a register configured to store impedance calibration information and further includes programmable termination resistances having a programmable impedance. The example apparatus further includes an impedance calibration circuit configured to perform a calibration operation to determine calibration parameters for setting the programmable impedance of the programmable termination resistances. The impedance calibration circuit is further configured to program the impedance calibration information in the register related to the calibration operation.
Claims21
A method comprising:
- initiating a calibration operation of a memory when a change in temperature exceeds a temperature range;
- arbitrating with one or more other memories for use of an external resistance, with an arbitration engine of the memory;
- obtaining control of the external resistance;
- and
- performing the calibration operation after control of the external resistance is obtained.
A method comprising:
- initiating a calibration operation of a memory when a temperature exceeds or falls below a temperature limit;
- arbitrating with one or more other memories for use of an external resistance, with an arbitration engine of the memory;
- obtaining control of the external resistance;
- and
- performing the calibration operation after control the external resistance is obtained.
An apparatus, comprising:
- a memory including:
- a temperature sensor configured to provide temperature information indicative of a temperature;
- and
- an impedance calibration circuit configured to perform a calibration operation to arbitrate with another memory for use of an external resistance and determine calibration parameters based on the temperature information provided by the temperature sensor.
The apparatus of 17, wherein the calibration information indicates whether the calibration information is completed.
Dependencies are inferred from the claim text.