Structure for pressurization analysis, X-ray diffraction apparatus and pressurization analysis system
AssigneeRigaku Corporation
InventorKoichiro Ito
Life of this patent
Estimating the term…
Abstract
A structure for pressurization analysis includes a sample accommodating unit (10) for accommodating an all-solid-state battery (S) therein, and a pressurizing unit (30) having a pressurizing mechanism for causing pressure to act on the all-solid-state battery (S). The all-solid-state battery (S) is pressurized inside the sample accommodating unit (10) while being sandwiched between a pressure receiving member (21) and a pressing member (22). Further, an X-ray window (14) is provided in an outer radial direction orthogonal to an acting direction of the pressure from the pressurizing unit (30), and reflection type X-ray diffraction measurement can be performed through the X-ray window (14).
Claims12
A structure for pressurization analysis comprising:
- a sample accommodating unit in which a sample chamber for accommodating and placing a sample therein is formed;
- and
- a pressurizing unit that is mounted on the sample accommodating unit and includes a pressurizing mechanism for causing pressure to act on the sample in the sample chamber,
- wherein the sample accommodating unit includes a pressure receiving portion for receiving pressure from the pressurizing unit at a position opposite to the pressurizing unit with respect to the sample in the sample chamber, and an X-ray window provided in a direction intersecting an acting direction of the pressure from the pressurizing unit, and is configured to receive X-rays through the X-ray window to irradiate the sample in the sample chamber with the X-rays, and emit diffracted X-rays reflected from the sample to an outside of the sample accommodating unit from the X-ray window, and
- wherein the X-ray window is blocked by a hermetically sealing member formed of a material through which X-rays are transmitted.
Dependencies are inferred from the claim text.