# US 11,908,811 B2 · System and method for physically detecting counterfeit electronics > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 11,908,811 B2 - Document ID: US11908811B2 - Status: Granted - Kind: B2 - Application number: 17/731,211 - Filed: 2022-04-27 - Published: 2022-11-03 - Granted: 2024-02-20 - Earliest claimed: 2011-03-02 - Assignees: Nokomis, Inc. - Applicants: Nokomis, Inc. - Inventors: Walter J. Keller, III; Stephen Dorn Freeman; Jason Galyardt - Web page: https://patentgrep.com/patent/US11908811B2 ## CPC - H10W 42/405: {using active circuits} - G01R 31/2837: {Characterising or performance testing, e.g. of frequency response (transient response G01R27/28)} - G06F 21/73: by creating or determining hardware identification, e.g. serial numbers - G01R 31/2839: {using signal generators, power supplies or circuit analysers (G01R31/2879 takes precedence; multimeters G01R15/12, network analysers G01R27/28)} - H10W 44/248: {for antennas} - H10W: GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10 - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) - G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N) ## Abstract A system for inspecting or screening electrically powered device includes a signal generator inputting a preselected signal into the electrically powered device. There is also an antenna array positioned at a pre-determined distance above the electrically powered device. Apparatus collects RF energy emitted by the electrically powered device in response to input of said preselected signal. The signature of the collected RF energy is compared with an RF energy signature of a genuine part. The comparison determines one of a genuine or counterfeit condition of the electrically powered device. ## Claims ### Claim 1 A method, comprising: inputting signals into a power input and a clock input of a semiconductor; collecting, with an antenna and a receiver coupled to the antenna, electromagnetic energy in a radio frequency (RF) spectrum emitted by the semiconductor in a response to inputting power and clock signals; processing, with a processor, an emission signature of collected electromagnetic energy against a baseline emission signature of a genuine semiconductor; and determining, with the processor and based on a comparison of a processed emission signature against the baseline emission signature, a condition of the semiconductor. ### Claim 2 (depends on 1) The method of claim 1, wherein inputting the signals into the power and clock inputs comprises inputting, with an oscillator signal source, an oscillating signal into the clock input. ### Claim 3 (depends on 1) The method of claim 1, wherein inputting the signals into the power and clock inputs comprises inputting, with an oscillator signal source, a monotonic oscillating signal into the clock input. ### Claim 4 (depends on 1) The method of claim 1, wherein inputting the signals into the power and clock inputs comprises inputting, with an oscillator signal source, a multi-tone oscillating signal into the clock input. ### Claim 5 (depends on 1) The method of claim 1, wherein inputting the signals into the power and clock inputs comprises inputting, with an oscillator signal source, a modulated oscillating signal into the clock input. ### Claim 6 (depends on 1) The method of claim 1, wherein inputting the signals into the power and clock inputs comprises inputting, with a high precision signal frequency oscillation generation source, an oscillating signal into the clock input. ### Claim 7 (depends on 1) The method of claim 1, wherein inputting the signals into the power and clock inputs comprises inputting the signals through a fixture configured to receive the semiconductor therewithin. ### Claim 8 (depends on 1) The method of claim 1, wherein processing the emission signature comprises obtaining discrete wavelet transform coefficient statistics. ### Claim 9 (depends on 1) The method of claim 1, wherein processing the emission signature comprises obtaining relative phase measurement and comparing obtained phase measurement to an anticipated phase measurement. ### Claim 10 (depends on 1) The method of claim 1, wherein processing the emission signature comprises performing a clustering analysis. ### Claim 11 (depends on 1) The method of claim 1, wherein determining the condition of semiconductor comprises determining a counterfeit or a genuine condition of the semiconductor. ### Claim 12 (depends on 1) The method of claim 1, wherein determining the condition of semiconductor comprises determining a genuine condition of the semiconductor by matching the processed emission signature with the baseline emission signature. ### Claim 13 (depends on 1) The method of claim 1, wherein determining the condition of semiconductor comprises analyzing at least one of frequency locations of emissions components, phases of emissions, cross-modulation and inter-modulation components generated by internal circuitry, shape of any individual emission, quality factors of any individual emissions or timing characteristics of emissions. ### Claim 14 (depends on 1) The method of claim 1, further comprising the semiconductor with a powered free-field illumination source during collection of the electromagnetic energy. ### Claim 15 (depends on 1) The method of claim 1, further comprising establishing the baseline emission signature of the semiconductor. ### Claim 16 (depends on 1) The method of claim 1, further comprising amplifying the emission signature of collected electromagnetic energy. ### Claim 17 A method, comprising: only inputting an oscillating signal into a clock input of a semiconductor; collecting, with an antenna and a receiver coupled to the antenna, electromagnetic energy in a radio frequency (RF) spectrum emitted by the semiconductor in a response to inputting the oscillating signal into the clock input; processing, with a processor, an emission signature of collected electromagnetic energy against a baseline emission signature of a genuine semiconductor; and determining, with the processor and based on a comparison of a processed emission signature against the baseline emission signature, a condition of the semiconductor. ### Claim 18 (depends on 17) The method of claim 17, further comprising changing a frequency setting of the oscillating signal and repeating inputting the oscillating signal, collecting the electromagnetic energy, processing the emission signature and determining the condition of the semiconductor. ### Claim 19 A method, comprising: only inputting a signal into a power input of a semiconductor; collecting, with an antenna and a receiver coupled to the antenna, electromagnetic energy in a radio frequency (RF) spectrum emitted by the semiconductor in a response to inputting the signal into the power input; processing, with a processor, an emission signature of collected electromagnetic energy against a baseline emission signature of a genuine semiconductor; and determining, with the processor and based on a comparison of a processed emission signature against the baseline emission signature, a condition of the semiconductor.