# US 11,908,529 B2 · Data storage device having over-voltage detection and protection

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- Number: US 11,908,529 B2
- Document ID: US11908529B2
- Status: Granted
- Kind: B2
- Application number: 17/579,246
- Filed: 2022-01-19
- Published: 2023-07-20
- Granted: 2024-02-20
- Earliest claimed: 2022-01-19
- Assignees: Western Digital Technologies, Inc.
- Applicants: Western Digital Technologies, Inc.
- Inventors: Daniel J. Linnen; Kirubakaran Periyannan; Khanfer A. Kukkady
- Web page: https://patentgrep.com/patent/US11908529B2

## CPC

- G11C 16/30: Power supply circuits
- G11C 5/143: {Detection of memory cassette insertion or removal; Continuity checks of supply or ground lines; Detection of supply variations, interruptions or levels (G11C5/148 takes precedence); Switching between alternative supplies (G11C5/141 takes precedence)}
- G11C 5/147: {Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops (G11C5/141 takes precedence)}
- G11C 16/22: Safety or protection circuits preventing unauthorised or accidental access to memory cells
- G11C 29/50: Marginal testing, e.g. race, voltage or current testing
- H02H 3/087: for DC applications
- H02H 3/202: {for DC systems}
- H02H 9/041: {using a short-circuiting device}
- G11C 17/16: using electrically-fusible links
- G11C 2029/0409: {Online test}
- G11C 2029/5004: {Voltage}
- G11C: STATIC STORES (semiconductor memory devices H10B)
- H02H: EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS (indicating or signalling undesired working conditions G01R, e.g. G01R31/00, G08B; locating faults along lines G01R31/08; emergency protective devices H01H)

## Abstract

A data storage device includes a power supply circuit configured to supply power to the data storage device. The power supply circuit includes a voltage clamp configured to operate in a conduction state in response to an over-voltage condition of the power supply circuit. The power supply circuit also includes a fuse in series with the voltage clamp. The fuse is configured to open in response to a current flow through the fuse and the voltage clamp exceeding a threshold value. The power supply circuit also includes a switching device that is configured to latch in a forward conduction mode in response to the voltage clamp operating in the conduction state. The switching device couples power from a positive voltage bus to the voltage clamp when the switching device is in the forward conduction mode.

## Claims

### Claim 1

A data storage device, comprising:
a power supply circuit configured to supply power to the data storage device, the power supply circuit including:
a voltage clamp configured to operate in a conduction state in response to an over-voltage condition of the power supply circuit;
a fuse in series with the voltage clamp and the positive voltage bus, wherein the fuse is configured to open in response to a current flowing through the fuse and the voltage clamp exceeding a threshold value; and
a switching device configured to latch in a forward conduction mode in response to the voltage clamp operating in the conduction state, wherein the switching device couples a positive voltage bus to the voltage clamp when operating in the forward conduction mode.

### Claim 2 (depends on 1)

The data storage device of claim 1, wherein the switching device is a thyristor.

### Claim 3 (depends on 1)

The data storage device of claim 1, wherein the voltage clamp is a Zener diode.

### Claim 4 (depends on 1)

The data storage device of claim 1, further comprising an over-voltage detection circuit configured to generate an indication that an over-voltage condition has occurred.

### Claim 5 (depends on 4)

The data storage device of claim 4, wherein the over-voltage detection circuit is a current-based over-voltage detection circuit configured to determine that the over-voltage condition has occurred based on detecting a switching device current flowing through the switching device.

### Claim 6 (depends on 4)

The data storage device of claim 4, wherein the over-voltage detection circuit is a voltage-based over-voltage detection circuit configured to determine that the over-voltage condition has occurred based on a change in a voltage at an output of the switching device.

### Claim 7 (depends on 4)

The data storage device of claim 4, further comprising a controller configured to:
receive the indication from the over-voltage detection circuit that the over-voltage condition has occurred; and
store a fault indicating that the over-voltage condition has occurred in a memory.

### Claim 8 (depends on 7)

The data storage device of claim 7, wherein the controller is further configured to transmit the fault to an external device.

### Claim 9

A method performed by a data storage device having a controller coupled to a non-volatile memory device, the method comprising:
detecting an occurrence of an over-voltage condition, wherein the over-voltage condition is detected by an over-voltage detection circuit;
operating a voltage clamp of the data storage device in a conduction state in response to the occurrence of the over-voltage condition;
latching a switching device of the data storage device in a forward conduction mode in response to the voltage clamp operating in the conduction state, wherein the switching device couples a positive voltage bus of a power supply circuit of the data storage device to the voltage clamp when operating in the forward conduction mode;
receiving an indication of the detected occurrence of the over-voltage condition at the controller;
storing the occurrence of the over-voltage condition in a memory; and
transmitting the occurrence of the over-voltage condition to an external device.

### Claim 10 (depends on 9)

The method of claim 9, further comprising disconnecting the data storage device from a power source in response to receiving the indication of the detected occurrence of the over-voltage condition.

### Claim 11 (depends on 9)

The method of claim 9, wherein the over-voltage detection circuit is a current-based over-voltage detection circuit.

### Claim 12 (depends on 9)

The method of claim 9, wherein the over-voltage detection circuit is a voltage-based over-voltage detection circuit.

### Claim 13 (depends on 9)

The method of claim 9, wherein the over-voltage detection circuit includes an opto-coupler.

### Claim 14

A data storage device, comprising:
a power supply circuit, including:
a voltage clamp configured to operate in a conduction state in response to an over-voltage condition of the power supply circuit;
a fuse in series with the voltage clamp and the positive voltage bus, wherein the fuse is configured to open in response to a current flowing through the fuse and the voltage clamp exceeding a threshold value;
a switching device configured to latch in a forward conduction mode in response to the voltage clamp operating in the conduction state, wherein the switching device couples a positive voltage bus to the voltage clamp when operating in the forward conduction mode; and
an over-voltage detection circuit configured to detect an occurrence of an over-voltage event.

### Claim 15 (depends on 14)

The data storage device of claim 14, wherein the over-voltage detection circuit is a current-based over-voltage detection circuit configured to determine that an over-voltage condition has occurred based on the current flowing through the switching device.

### Claim 16 (depends on 14)

The data storage device of claim 14, wherein the over-voltage detection circuit is a voltage-based over-voltage detection circuit configured to determine that an over-voltage condition has occurred based on a change in a voltage at an output of the switching device.

### Claim 17 (depends on 14)

The data storage device of claim 14, further comprising a controller configured to:
receive an indication from the over-voltage detection circuit that an over-voltage condition has occurred; and
store the occurrence of the over-voltage condition in a memory.

### Claim 18 (depends on 17)

The data storage device of claim 17, wherein the controller is further configured to transmit the occurrence of the over-voltage condition to an external device.

### Claim 19 (depends on 14)

The data storage device of claim 14, wherein the switching device is a thyristor.

### Claim 20 (depends on 14)

The data storage device of claim 14, wherein the voltage clamp is a Zener diode.
