# US 11,907,090 B2 · Machine learning for taps to accelerate TDECQ and other measurements > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 11,907,090 B2 - Document ID: US11907090B2 - Status: Granted - Kind: B2 - Application number: 17/876,817 - Filed: 2022-07-29 - Published: 2023-02-16 - Granted: 2024-02-20 - Earliest claimed: 2021-08-12 - Assignees: Tektronix, Inc. - Applicants: Tektronix, Inc. - Inventors: Kan Tan; John J. Pickerd - Web page: https://patentgrep.com/patent/US11907090B2 ## CPC - G06F 11/2733: {Test interface between tester and unit under test} - H04B 17/3912: {Simulation models, e.g. distribution of spectral power density or received signal strength indicator [RSSI] for a given geographic region} - G06F 11/267: Reconfiguring circuits for testing, e.g. LSSD, partitioning - G06N 20/00: Machine learning - G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N) - H04B: TRANSMISSION - G06N: COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS ## Abstract A test and measurement instrument has an input configured to receive a signal from a device under test, a memory, a user interface to allow the user to input settings for the test and measurement instrument, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to: acquire a waveform representing the signal received from the device under test; generate one or more tensor arrays based on the waveform; apply machine learning to the one or more tensor arrays to produce equalizer tap values; and apply equalization to the waveform using the equalizer tap values to produce an equalized waveform; and perform a measurement on the equalized waveform to produce a value related to a performance requirement for the device under test. A method of testing a device under test includes acquiring a waveform representing a signal received from the device under test, generating one or more tensor arrays based on the waveform, applying machine learning to the one or more tensor arrays to produce equalizer tap values, applying the equalizer taps values to the waveform to produce an equalized waveform, performing a measurement on the equalized waveform to produce a value related to a performance requirement for the device under test. ## Claims ### Claim 1 A test and measurement instrument, comprising: an input configured to receive a signal from a device under test; a memory; a user interface to allow a user to input settings for the test and measurement instrument; and one or more processors, the one or more processors configured to execute code that causes the one or more processors to: acquire a waveform representing the signal received from the device under test; generate one or more tensor arrays based on the waveform; apply machine learning to the one or more tensor arrays to produce equalizer tap values; and apply equalization to the waveform using the equalizer tap values to produce an equalized waveform; and perform a measurement on the equalized waveform to produce a value related to a performance requirement for the device under test. ### Claim 2 (depends on 1) The test and measurement instrument as claimed in claim 1, wherein the one or more processors are further configured to execute code to determine whether the value indicates that the device under test meets the performance requirement. ### Claim 3 (depends on 1) The test and measurement instrument as claimed in claim 1, wherein the code that causes the one more processors to apply machine learning comprises code to cause the one or more processors to send the tensor arrays to a machine learning network on a device separate from the test and measurement instrument. ### Claim 4 (depends on 1) The test and measurement instrument as claimed in claim 1, wherein the code to cause the one or more processors to apply machine learning to the one or more tensor arrays to produce equalizer tap values comprises code to cause the one or more processors to produce feed-forward equalizer tap values for a feed-forward equalizer (FFE). ### Claim 5 (depends on 1) The test and measurement instrument as claimed in claim 1, wherein the code to cause the one or more processors to perform a measurement on the equalized waveform comprises code to cause the one or more processors to perform a transmitter and dispersion eye closure quaternary (TDECQ) measurement on the equalized waveform to produce the value. ### Claim 6 (depends on 1) The test and measurement instrument as claimed in claim 1, wherein the one or more processors are further configured to execute code to cause the one or more processors to train a machine learning network, the code to cause the one or more processors to: receive a training waveform; use the training waveform to produce training equalizer tap values; generate one or more training tensor arrays from the training waveform; and provide the one or more training tensor arrays and the training equalizer tap values to the machine learning network as a training data set. ### Claim 7 (depends on 6) The test and measurement instrument as claimed in claim 6, wherein the code to cause the one or more processors to produce the training equalizer tap values comprises code to produce the training equalizer tap values for a feed-forward equalizer. ### Claim 8 (depends on 1) The test and measurement instrument as claimed in claim 1, further comprising a probe, wherein the device under test is coupled to the input by the probe. ### Claim 9 (depends on 8) The test and measurement instrument as claimed in claim 8, wherein the probe comprises an optical fiber. ### Claim 10 (depends on 8) The test and measurement instrument as claimed in claim 8, wherein the probe comprises an optical to electrical converter. ### Claim 11 (depends on 8) The test and measurement instrument as claimed in claim 8, wherein the probe is configured to connect to the device under test operating under IEEE standard 802.3. ### Claim 12 A method of testing a device under test, comprising: acquiring a waveform representing a signal received from the device under test; generating one or more tensor arrays based on the waveform; applying machine learning to the one or more tensor arrays to produce equalizer tap values; applying the equalizer tap values to the waveform to produce an equalized waveform; and performing a measurement on the equalized waveform to produce a value related to a performance requirement for the device under test. ### Claim 13 (depends on 12) The method as claimed in claim 12, further comprising determining whether the value indicates that the device under test meets the performance requirement. ### Claim 14 (depends on 12) The method as claimed in claim 12, wherein applying machine learning to the one or more tensor arrays to produce equalizer tap values comprises applying machine learning to the one or more tensor arrays to produce feed-forward equalizer tap values. ### Claim 15 (depends on 14) The method as claimed in claim 14, wherein the feed-forward equalizer tap values are for a 5-tap feed forward equalizer. ### Claim 16 (depends on 12) The method as claimed in claim 12, wherein performing a measurement on the equalized waveform comprises measuring a transmitter and dispersion eye closure quaternary (TDECQ) of the equalized waveform. ### Claim 17 (depends on 12) The method as claimed in claim 12, further comprising training a machine learning network, the training comprising: receiving a training waveform; using the training waveform to produce training equalizer tap values; and generating one or more training tensor arrays from the training waveform; and providing the one or more training tensor arrays and the training equalizer tap values to the machine learning network as a training data set. ### Claim 18 (depends on 17) The method as claimed in claim 17, wherein using the training waveform to produce the training equalizer tap values comprises using the training waveform to produce the training equalizer tap values for a feed-forward equalizer. ### Claim 19 (depends on 12) The method as claimed in claim 12, wherein acquiring the waveform representing the signal received from the device under test comprises receiving an optical signal through a test fiber, the optical signal created by operation of the device under test. ### Claim 20 (depends on 19) The method as claimed in claim 19, further comprising converting the optical signal to an electrical signal.